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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Buschmann, V.; Fedina, L.; Rodewald, M.; Van Tendeloo, G. |
A new model for the (2x1) reconstructed CoSi2-Si(100) interface |
1998 |
Philosophical magazine letters |
77 |
10 |
UA library record; WoS full record; WoS citing articles |
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Chen, J.H.; Bernaerts, D.; Seo, J.W.; Van Tendeloo, G.; Kagi, H. |
Voidites in polycrystalline natural diamond |
1998 |
Philosophical magazine letters |
77 |
7 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
On the mechanism of {111}-defect formation in silicon studies by in situ electrin irradiation in a high resolution electron microscope |
1998 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
77 |
23 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Study of ramp-type Josephson junctions by HREM |
1997 |
Electronic Applications; Vol 2: Large Scale And Power Applications |
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UA library record; WoS full record; |
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Vanhellemont, J.; Bender, H.; van Landuyt, J. |
TEM studies of processed Si device materials |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J. |
In-situ HREM irradiation study of point defect clustering in strained GexSi1-x/(001)Si heterostructure |
1997 |
Conference series of the Institute of Physics |
157 |
1 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
New intermediate defect configuration in Si studied by in situ HREM irradiation |
1997 |
Conference series of the Institute of Physics |
157 |
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UA library record; WoS full record; |
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Verbist, K.; Lebedev, O.I.; Verhoeven, M.A.J.; Winchern, R.; Rijnders, A.J.H.M.; Blank, D.H.A.; Tafuri, F.; Bender, H.; Van Tendeloo, G. |
Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties |
1998 |
Superconductor science and technology |
11 |
|
UA library record; WoS full record; WoS citing articles |
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Barnabé, A.; Millange, F.; Maignan, A.; Hervieu, M.; Raveau, B.; Van Tendeloo, G.; Laffez, P. |
Barium-based manganites Ln1-xBaxMnO3 with Ln = {Pr, La}: phase transitions and magnetoresistance properties |
1998 |
Chem. mater. |
10 |
48 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Electron microscopy of carbon nanotubes and related structures |
1997 |
The journal of physics and chemistry of solids |
58 |
12 |
UA library record; WoS full record; WoS citing articles |
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Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. |
Ab initio computation of the mean inner Coulomb potential of technological important semiconductors |
2005 |
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1007 |
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UA library record; WoS full record; |
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Schryvers, D.; Tirry, W.; Yang, Z. |
Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates |
2005 |
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UA library record; WoS full record; |
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Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
|
UA library record |
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Mahieu, S.; Ghekiere, P.; de Winter, G.; de Gryse, R.; Depla, D.; Lebedev, O.I. |
Biaxially aligned yttria stabilized zirconia and titanium nitride layers deposited by unbalanced magnetron sputtering |
2005 |
Diffusion and defect data : solid state data : part B : solid state phenomena
T2 – 2nd International Conference on Texture and Anisotropy of Polycrystals, JUL 07-09, 2004, Metz, FRANCE |
105 |
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UA library record; WoS full record; WoS citing articles |
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Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Calculation of Debye-Waller temperature factors for GaAs |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
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Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. |
Catalyst traces after chemical purification in CVD grown carbon nanotubes |
2001 |
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UA library record; WoS full record; WoS citing articles |
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Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
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UA library record; WoS full record; |
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De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
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UA library record; WoS full record; |
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Yang, Z.; Schryvers, D. |
Composition gradients surrounding Ni4Ti3 precipitates in a NiTi alloy studied by EELS, EFTEM and EDX |
2006 |
International journal of applied electromagnetics and mechanics |
23 |
|
UA library record; WoS full record; |
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Moshnyaga, V.; Damaschke, B.; Shapoval, O.; Belenchuk, A.; Faupel, J.; Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Mücksch, M.; Tsurkan, V.; Tidecks, R.; Samwer, K. |
Corrigendum: Structural phase transition at the percolation threshold in epitaxial (La0.7Ca0.3MnO3)1-x:(MgO)x nanocomposite films |
2005 |
Nature materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Van Tendeloo, G. |
Crystalline and amorphous frameworks with giant pores: what information ca we expect from advanced TEM? |
2008 |
Electron microscopy and multiscale modeling: proceedings of the AIP conference proceedings |
999 |
|
UA library record; WoS full record; WoS citing articles |
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Blumenau, A.T.; Frauenheim, T.; Öberg, S.; Willems, B.; Van Tendeloo, G. |
Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy |
2004 |
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UA library record; WoS full record; WoS citing articles |
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
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Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. |
EFTEM study of plasma etched low-k Si-O-C dielectrics |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND |
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UA library record; WoS full record; |
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Ghica, C.; Enculescu, I.; Nistor, L.C.; Matei, E.; Van Tendeloo, G. |
Electrochemical growth and characterization of nanostructured ZnO thin films |
2008 |
Journal of optoelectronics and advanced materials |
10 |
|
UA library record; WoS full record; |
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Leys, F.E.; March, N.H.; Lamoen, D.; van Doren, V.E. |
Equations of state of tantalum and plutonium in a spherical cell approximation and at extremely high pressures |
2002 |
|
22 |
|
UA library record; WoS full record; WoS citing articles |
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Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. |
First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs |
2005 |
|
107 |
|
UA library record; WoS full record; |
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Lexcellent, C.; Vivet, A.; Bouvet, C.; Blanc, P.; Satto, C.; Schryvers, D. |
From the lattice measurements of the austenite and the martensite cells to the macroscopic mechanical behavior of shape memory alloys |
2001 |
Journal de physique: 4 |
11 |
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UA library record; WoS full record; WoS citing articles |
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Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
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UA library record; WoS full record; |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
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