|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Van Aert, S.; van Dyck, D. |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
2001 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
81 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Doria, M.M.; de Romaguera, A.R.C.; Milošević, M.V.; Peeters, F.M. |
Domain coexistence of magnetism and superconductivity : appearance of confined vortex loops |
2008 |
Journal of physics : conference series |
97 |
|
UA library record; WoS full record |
|
|
Peirs, J.; Verleysen, P.; Tirry, W.; Rabet, L.; Schryvers, D.; Degrieck, J. |
Dynamic shear localization in Ti6Al4V |
2011 |
Procedia Engineering
T2 – 11th International Conference on the Mechanical Behavior of Materials, (ICM), 2011, Como, ITALY (ICM11) |
|
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Lin, N. |
Dynamics of interacting clusters in low-dimensional superconductors |
2012 |
|
|
|
UA library record |
|
|
Wang, X.; Amin-Ahmadi, B.; Schryvers, D.; Verlinden, B.; Van Humbeeck, J. |
Effect of annealing on the transformation behavior and mechanical properties of two nanostructured Ti-50.8at.%Ni thin wires produced by different methods |
2013 |
Materials science forum |
738/739 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
|
|
Zhang, L. |
Effects of quantum confinement in nanoscale superconductors : from electronic density of states to vortex matter |
2015 |
|
|
|
UA library record |
|
|
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. |
EFTEM study of plasma etched low-k Si-O-C dielectrics |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND |
|
|
UA library record; WoS full record; |
|
|
Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
|
|
Avetisyan, A.A.; Partoens, B.; Peeters, F.M. |
Electric field tuning of the band gap in four layers of graphene with different stacking order |
2012 |
Proceedings of the Society of Photo-optical Instrumentation Engineers
T2 – Conference on Photonics and Micro and Nano-structured Materials, JUN 28-30, 2011, Yerevan, ARMENIA |
|
|
UA library record; WoS full record |
|
|
Colomer, J.-F.; Van Tendeloo, G. |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
2003 |
|
|
|
UA library record |
|
|
Colomer, J.-F.; Henrard, L.; Lambin, P.; Van Tendeloo, G. |
Electron diffraction of nanotubes bundles : unique helicity and tube-tube atomically coherent packing |
2002 |
AIP conference proceedings
T2 – 16th International Winterschool on Electronic Properties of Novel, Materials, MAR 02-09, 2002, KIRCHBERG, AUSTRIA |
|
|
UA library record; WoS full record |
|
|
Lu, Y. |
Electron energy-loss spectroscopy (EELS) characterization of diamond and related materials |
2013 |
|
|
|
UA library record |
|
|
Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
|
Pauwels, B.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. |
Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles |
1999 |
|
|
|
UA library record |
|
|
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
|
|
|
UA library record |
|
|
Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
|
|
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UA library record; WoS full record; |
|
|
Biermans, E. |
Electron tomography : from qualitative to quantitative |
2012 |
|
|
|
UA library record |
|
|
Masir, M.R. |
Electronic properties of graphene in inhomogeneous magnetic fields |
2012 |
|
|
|
UA library record |
|
|
Kishore, V.V.R. |
Electronic structure of core-shell nanowires |
2013 |
|
|
|
UA library record |
|
|
Shi, H.; Frenzel, J.; Schryvers, D. |
EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys |
2013 |
Materials science forum |
738/739 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
|
|
|
UA library record |
|
|
Partoens, B.; Peeters, F.M. |
Enhanced spin and isospin blockade in two vertically coupled quantum dots |
2001 |
|
|
|
UA library record; WoS full record; |
|
|
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
|
|
|
UA library record |
|
|
Fomin, V.M.; Devreese, J.T.; Misko, V.R. |
Enhancement of critical magnetic field in superconducting nanostructures |
2002 |
|
1 |
|
UA library record |
|
|
Leys, F.E.; March, N.H.; Lamoen, D.; van Doren, V.E. |
Equations of state of tantalum and plutonium in a spherical cell approximation and at extremely high pressures |
2002 |
|
22 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
|