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| Author | Zelaya, E.; Schryvers, D. | ||||
| Title | Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite | Type | A1 Journal article | ||
Year  |
2011 | Publication | Microscopy research and technique | Abbreviated Journal | Microsc Res Techniq |
| Volume | 74 | Issue | 1 | Pages | 84-91 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000285976000012 | Publication Date | 2010-05-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1059-910X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.147 | Times cited | 2 | Open Access | |
| Notes | Approved | Most recent IF: 1.147; 2011 IF: 1.792 | |||
| Call Number | UA @ lucian @ c:irua:85994 | Serial | 2852 | ||
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