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Title
Year
Publication
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Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
1999
Journal of the American Society for Mass Spectrometry
10
4
UA library record
;
WoS full record
;
WoS citing articles
