| Records |
| Author |
van Langevelde, F.; Janssens, K.H.; Adams, F.C.; Vis, R.D. |
| Title |
Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble) |
Type |
A1 Journal article |
Year  |
1992 |
Publication |
Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment |
Abbreviated Journal |
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| Volume |
317 |
Issue |
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Pages |
383-393 |
| Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
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Thesis |
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Place of Publication |
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Editor |
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Wos |
A1992JF39700044 |
Publication Date |
2002-11-12 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0168-9002 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ admin @ c:irua:2810 |
Serial |
5783 |
| Permanent link to this record |
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| Author |
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
| Title |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
Type |
A3 Journal article |
| Year |
1992 |
Publication |
Advances in X-ray analysis |
Abbreviated Journal |
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| Volume |
35 |
Issue |
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Pages |
1265-1273 |
| Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
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Thesis |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0376-0308 |
ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ admin @ c:irua:2811 |
Serial |
5530 |
| Permanent link to this record |
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| Author |
Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. |
| Title |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
Type |
P3 Proceeding |
| Year |
1992 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
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Thesis |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Series Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
no |
| Call Number |
UA @ admin @ c:irua:4190 |
Serial |
5531 |
| Permanent link to this record |
