|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1992 |
|
|
|
UA library record |
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Babu, T.G.N.; Greaves, C. |
The modulated structure of Ca.85CuO2 as studied by means of electron diffraction and microscopy |
1992 |
Journal of solid state chemistry |
97 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Schryvers, D.; Van Landuyt, J. |
Electron microscopy study of twin sequences and branching in NissAl34 3R martensite |
1992 |
ICOMAT |
|
|
|
|
|
Tanner, L.E.; Shapiro, S.M.; Krumhansl, J.A; Schryvers, D.; Noda, Y.; Yamada, Y.; Barsch, G.R.; Gooding, R.; Moss, S.C. |
Firsto order phase transformation in the Ni-Al system |
1992 |
Metallurgy and Ceramics |
|
|
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
|
|
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. |
Defects in high-dose oxygen implanted silicon : a TEM study |
1991 |
Vacuum: the international journal and abstracting service for vacuum science and technology
T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Schryvers, D.; de Saegher, B.; van Landuyt, J. |
Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al |
1991 |
Materials research bulletin |
26 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
|
|
|
UA library record |
|
|
Schryvers, D. |
Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study |
1991 |
|
|
|
UA library record |
|
|
Shapiro, S.M.; Yang, B.X.; Noda, Y.; Tanner, L.E.; Schryvers, D. |
Neutron-scattering and electron microscopy studies of premartensitic phenomena in NixAl100-x alloys |
1991 |
Physical review : B : condensed matter and materials physics |
44 |
123 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Tendeloo, G.; Schryvers, D.; Tanner, L.E.; Broddin, D.; Ricolleau, C.; Loiseau, A. |
Structural phase transformations in alloys: an electron microscopy study |
1991 |
Symposium on Pahse Transformations |
|
|
UA library record |
|
|
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The study of high Tc-superconducting materials by electron microscopy and electron diffraction |
1991 |
Superconductor science and technology
T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND |
4 |
2 |
UA library record; WoS full record; WoS citing articles |
|