|
Author |
Title |
Year ![sorted by Year field, ascending order (up)](img/sort_asc.gif) |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
Advances in X-ray analysis |
35 |
|
UA library record |
|
|
Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
|
|
|
UA library record |
|
|
van Langevelde, F.; Janssens, K.H.; Adams, F.C.; Vis, R.D. |
Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble) |
1992 |
Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment |
317 |
|
UA library record; WoS full record; WoS citing articles |
|