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Author Janssens, K.; Vincze, L.; Vekemans, B.; Aerts, A.; Adams, F.; Jones, K.W.; Knöchel, A.
  Title Synchrotron radiation induced X-ray microfluorescence analysis Type A1 Journal article
  Year (up) 1996 Publication Microchimica acta T2 – 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE Abbreviated Journal 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Micro
  Volume Issue s:[13] Pages 87-115
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
  Abstract mu-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for mu-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of mu-XRF are contrasted to that of other microanalytical techniques, Also, this issue of quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.
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  Language Wos A1996VT82300006 Publication Date
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ admin @ c:irua:104410 Serial 5866
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