| Records |
| Author |
Bladt, E. |
| Title |
Two- and three-dimensional transmission electron microscopy of colloidal nanoparticles : from struture to composition |
Type |
Doctoral thesis |
| Year |
2017 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:146083 |
Serial |
4756 |
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| Author |
Schattschneider, P.; Schachinger, T.; Verbeeck, J. |
| Title |
Ein Whirlpool aus Elektronen: Transmissions-Elektronenmikroskopie mit Elektronenwirbeln |
Type |
A1 Journal article |
| Year |
2018 |
Publication |
Physik in unserer Zeit |
Abbreviated Journal |
Phys. Unserer Zeit |
| Volume |
49 |
Issue |
1 |
Pages |
22-28 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Elektronen bewegen sich im feldfreien Raum immer gleichförmig geradlinig, so steht es in den Lehrbüchern. Falsch, sagen wir. Elektronen lassen sich zu Tornados formen, die theoretisch Nanopartikel zerreißen können. In der Elektronenmikroskopie eingesetzt, versprechen sie neue Erkenntnisse in der Festkörperphysik. |
| Address |
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Wos |
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Publication Date |
2018-01-02 |
| Series Editor |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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| ISSN |
0031-9252 |
ISBN |
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UA library record |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @c:irua:148159 |
Serial |
4806 |
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| Author |
van den Bos, K.H.W. |
| Title |
Quantitative atomic resolution transmission electron microscopy for heterogeneous nanomaterials |
Type |
Doctoral thesis |
| Year |
2017 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:147953 |
Serial |
4892 |
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| |
| Author |
Şentosun, K. |
| Title |
2D and 3D characterization of plasmonic and porous nanoparticles using transmission electron microscopy |
Type |
Doctoral thesis |
| Year |
2018 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Place of Publication |
Antwerp |
Editor |
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Wos |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:149802 |
Serial |
4926 |
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| |
| Author |
Karakulina, O. |
| Title |
Quantitative electron diffraction tomography for structure characterization of cathode materials for Li-ion batteries |
Type |
Doctoral thesis |
| Year |
2018 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Place of Publication |
Antwerpen |
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Edition |
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ISBN |
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Additional Links |
UA library record |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:151805 |
Serial |
5039 |
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| |
| Author |
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. |
| Title |
Investigating lattice strain in Au nanodecahedrons |
Type |
P1 Proceeding |
| Year |
2016 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
11-12 |
| Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
2016-12-21 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
978-3-527-80846-5 |
ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:145813 |
Serial |
5144 |
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| |
| Author |
Korneychuk, S. |
| Title |
Local study of the band gap and structure of diamond-based nanomaterials by analytical transmission electron microscopy |
Type |
Doctoral thesis |
| Year |
2018 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Place of Publication |
Antwerpen |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:154653 |
Serial |
5112 |
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| |
| Author |
Winckelmans, N. |
| Title |
Advanced electron tomography to investigate the growth of homogeneous and heterogeneous nanoparticles |
Type |
Doctoral thesis |
| Year |
2018 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Place of Publication |
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Editor |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:153855 |
Serial |
5077 |
| Permanent link to this record |
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| Author |
Claes, N. |
| Title |
3D characterization of coated nanoparticles and soft-hard nanocomposites |
Type |
Doctoral thesis |
| Year |
2018 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Antwerpen |
Editor |
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Wos |
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Publication Date |
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Series Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:154146 |
Serial |
5075 |
| Permanent link to this record |
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| |
| Author |
Nord, M.; Verbeeck, J. |
| Title |
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control |
Type |
P1 Proceeding |
| Year |
2019 |
Publication |
Microscopy and microanalysis
T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon |
Abbreviated Journal |
Microsc Microanal |
| Volume |
25 |
Issue |
S2 |
Pages |
232-233 |
| Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2019-08-05 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
1431-9276 |
ISBN |
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Additional Links |
UA library record |
| Impact Factor |
1.891 |
Times cited |
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Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.891 |
| Call Number |
EMAT @ emat @c:irua:164058 |
Serial |
5377 |
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| |
| Author |
Cautaerts, N. |
| Title |
Nanoscale study of ageing and irradiation induced precipitates in the DIN 1.4970 alloy |
Type |
Doctoral thesis |
| Year |
2019 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
306 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:161997 |
Serial |
5392 |
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| Author |
Fatermans, J. |
| Title |
Quantitative atom detection from atomic-resolution transmission electron microscopy images |
Type |
Doctoral thesis |
| Year |
2019 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
155 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Editor |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:162101 |
Serial |
5394 |
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| Author |
Yao, X. |
| Title |
An advanced TEM study on quantification of Ni4Ti3 precipitates in low temperature aged Ni-Ti shape memory alloy |
Type |
Doctoral thesis |
| Year |
2019 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
149 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Thesis |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:164987 |
Serial |
6284 |
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| |
| Author |
Callaert, C. |
| Title |
Characterization of defects, modulations and surface layers in topological insulators and structurally related compounds |
Type |
Doctoral thesis |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
180 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:165867 |
Serial |
6288 |
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| Author |
Pourbabak, S. |
| Title |
Influence of nano and microstructural features and defects in finegrained NiTi on the thermal and mechanical reversibility of the martensitic transformation |
Type |
Doctoral thesis |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
166 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:165919 |
Serial |
6305 |
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| Author |
Lumbeeck, G. |
| Title |
Mechanisms of nano-plasticity in as-deposited and hydrided nanocrystalline Pd and Ni thin films |
Type |
Doctoral thesis |
| Year |
2019 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
130 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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Thesis |
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Place of Publication |
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Series Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:164918 |
Serial |
6309 |
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| Author |
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. |
| Title |
Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial |
Type |
A1 Journal article |
| Year |
2019 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
| Volume |
25 |
Issue |
S2 |
Pages |
2684-2685 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2019-08-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
1431-9276 |
ISBN |
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Additional Links |
UA library record |
| Impact Factor |
|
Times cited |
|
Open Access |
|
| Notes |
|
Approved |
no |
| Call Number |
EMAT @ emat @c:irua:172444 |
Serial |
6424 |
| Permanent link to this record |
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| |
| Author |
Cautaerts, N.; Lamm, S.; Stergar, E.; Pakarinen, J.; Yang, Y.; Hofer, C.; Schnitzer, R.; Felfer, P.; Verwerft, M.; Delville, R.; Schryvers, D. |
| Title |
Atom probe tomography data collection from DIN 1.4970 (15-15Ti) austenitic stainless steel irradiated with Fe ions |
Type |
Dataset |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
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| Keywords |
Dataset; Electron microscopy for materials research (EMAT) |
| Abstract |
This dataset comprises a large collection of atom probe tomography datasets collected from DIN 1.4970 alloy that was irradiated with Fe ions at different conditions. The DIN 1.4970 alloy is an austenitic stainless steel with 15 wt% Cr, 15 wt% Ni, a small addition of Ti. The full composition and characterization of our material can be found published elsewhere [1,2]. Some of our material was subjected to ageing heat treatments at different temperatures for different times. Small samples of our original material and aged material was irradiated at the Michigan Ion Beam Laboratory in 2017 with 4.5 MeV Fe ions up to 40 dpa at an average dose rate of 2×10−4 dpa/s. This was done at three different temperatures: 300, 450, and 600 ºC. Atom probe samples were made of the irradiated layers (approximately 1.5 micron deep) with focused ion beam and mounted on Microtip coupons. APT measurements took place on three CAMECA LEAP-HR systems located at CAES in Idaho Falls, USA (files beginning with R33), at Montanuniversität Leoben in Leoben, Austria (R21) and at Friedrich–Alexander University in Erlangen, Germany (R56). |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
; ; |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:169127 |
Serial |
6454 |
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| Author |
Poma, G.; McGrath, T.J.; Christia, C.; Govindan, M.; Covaci, A. |
| Title |
Emerging halogenated flame retardants in the indoor environment |
Type |
A1 Journal article |
| Year |
2020 |
Publication |
Comprehensive analytical chemistry |
Abbreviated Journal |
|
| Volume |
88 |
Issue |
|
Pages |
107-140 |
| Keywords |
A1 Journal article; Pharmacology. Therapy; Electron microscopy for materials research (EMAT); Toxicological Centre |
| Abstract |
Indoor environments are considered an important contributor to external human exposure to halogenated flame retardants (HFRs) due to the large amounts of chemicals currently incorporated in indoor equipment and the time humans spend every day in indoor environments. In this chapter, the presence and use of novel brominated flame retardants (NBFRs), dechlorane plus (DPs), chlorinated organophosphorus flame retardants (Cl-PFRs) and chlorinated paraffins (CPs) in indoor dust, air and consumer products collected from different indoor microenvironments (homes, public indoor spaces, and vehicles) are discussed. While data on the concentrations of HFRs in indoor dust and air are widely available, figures are still scarce for consumer products, such as textiles and foams, furnishings, flooring, electric and electronic products and building materials. This knowledge gaps still represents the biggest obstacle in linking eventual sources of contamination to the presence and chemical patterns in indoor dust and air. |
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Wos |
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Publication Date |
2019-11-22 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
978-0-444-64339-1 |
ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
OpenAccess |
| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:168776 |
Serial |
6505 |
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| |
| Author |
Hendrickx, M. |
| Title |
Study of the effect of cation substitution on the local structure and the properties of perovskites and Li-ion battery cathode materials |
Type |
Doctoral thesis |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
208 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
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Wos |
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Publication Date |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:173128 |
Serial |
6618 |
| Permanent link to this record |
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| |
| Author |
Milagres de Oliveira, T. |
| Title |
Three-dimensional characterisation of nanomaterials : from model-like systems to real nanostructures |
Type |
Doctoral thesis |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
230 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
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Thesis |
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Publication Date |
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Series Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:170020 |
Serial |
6627 |
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| |
| Author |
Vanrompay, H. |
| Title |
Toward fast and dose efficient electron tomography |
Type |
Doctoral thesis |
| Year |
2020 |
Publication |
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Abbreviated Journal |
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| Volume |
|
Issue |
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Pages |
207 p. |
| Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:169852 |
Serial |
6632 |
| Permanent link to this record |
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| |
| Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
| Title |
Atom column detection |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
| Volume |
|
Issue |
|
Pages |
177-214 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
By combining statistical parameter estimation and model-order selection using a Bayesian framework, the maximum a posteriori (MAP) probability rule is proposed in this chapter as an objective and quantitative method to detect atom columns from high-resolution scanning transmission electron microscopy (HRSTEM) images. The validity and usefulness of this approach is demonstrated to both simulated and experimental annular dark-field (ADF) STEM images, but also to simultaneously acquired annular bright-field (ABF) and ADF STEM image data. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177531 |
Serial |
6775 |
| Permanent link to this record |
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| |
| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Atom counting |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
| Volume |
|
Issue |
|
Pages |
91-144 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this chapter, a statistical model-based method to count the number of atoms of monotype crystalline nanostructures from high-resolution annular dark-field (ADF) scanning transmission electron microscopy (STEM) images is discussed in detail together with a thorough study on the possibilities and inherent limitations. We show that this method can be applied to nanocrystals of arbitrary shape, size, and atom type. The validity of the atom-counting results is confirmed by means of detailed image simulations and it is shown that the high sensitivity of our method enables us to count atoms with single atom sensitivity. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177529 |
Serial |
6776 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Efficient fitting algorithm |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
73-90 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic-resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighboring columns, enabling the analysis of a large field of view. To provide end-users with this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. In this chapter, this efficient algorithm is applied to three different nanostructures for which the analysis of a large field of view is required. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177528 |
Serial |
6778 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
General conclusions and future perspectives |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
243-253 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
This chapter provides an overview of statistical and quantitative methodologies that have pushed (scanning) transmission electron microscopy ((S)TEM) toward accurate and precise measurements of unknown structure parameters for understanding the relation between the structure of a material and its properties. Hereby, statistical parameter estimation theory has extensively been used which enabled not only measuring atomic column positions, but also quantifying the number of atoms, and detecting atomic columns as accurately and precisely as possible from experimental images. As a general conclusion, it can be stated that advanced statistical techniques are ideal tools to perform quantitative electron microscopy at the atomic scale. In the future, statistical methods will continue to be developed and novel quantification procedures will open up new possibilities for studying material structures at the atomic scale. |
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Place of Publication |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177533 |
Serial |
6781 |
| Permanent link to this record |
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| Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
| Title |
Image-quality evaluation and model selection with maximum a posteriori probability |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
215-242 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods. |
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Place of Publication |
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Wos |
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Publication Date |
2021-03-06 |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177532 |
Serial |
6782 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Introduction |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
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Pages |
1-28 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177525 |
Serial |
6784 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
145-175 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this chapter, the principles of detection theory are used to quantify the probability of error for atom counting from high-resolution scanning transmission electron microscopy (HRSTEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom counting using the expression of the probability of error. We show that for very thin objects the low-angle annular dark-field (LAADF) regime is optimal and that for thicker objects the optimal inner detector angle increases. |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177530 |
Serial |
6785 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Statistical parameter estimation theory : principles and simulation studies |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
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Pages |
29-72 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this chapter, the principles of statistical parameter estimation theory for a quantitative analysis of atomic-resolution electron microscopy images are introduced. Within this framework, electron microscopy images are described by a parametric statistical model. Here, parametric models are introduced for different types of electron microscopy images: reconstructed exit waves, annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, and simultaneously acquired ADF and annular bright-field (ABF) STEM images. Furthermore, the Cramér-Rao lower bound (CRLB) is introduced, i.e. a theoretical lower bound on the variance of any unbiased estimator. This CRLB is used to quantify the precision of the structure parameters of interest, such as the atomic column positions and the integrated atomic column intensities. |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177527 |
Serial |
6788 |
| Permanent link to this record |
