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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Yang, Z.; Geise, H.J.; Mehbod, M.; Debrue, G.; Visser, J.W.; Sonneveld, E.J.; Van 't dack, L.; Gijbels, R. |
Conductivity and electron density of undoped model compounds of poly(phenylene vinylene) |
1990 |
Synthetic metals |
39 |
25 |
UA library record; WoS full record; WoS citing articles |
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Shazali, I.; Van 't dack, L.; Gijbels, R. |
Determination of precious metals in ores and rocks by thermal neutron activation/\gamma-spectrometry after preconcentration by nickel sulphide fire assay and coprecipitation with tellurium |
1987 |
Analytica chimica acta |
196 |
49 |
UA library record; WoS full record; WoS citing articles |
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Bosch, B.; Leleu, M.; Oustrière, P.; Sarcia, C.; Sureau, J.F.; Blommaert, W.; Gijbels, R.; Sadurski, A.; Vandelannoote, R.; Van Grieken, R.; Van 'T Dack, L.; |
Hydrogeochemistry in the zinclead mining district of Les Malines (Gard, France) |
1986 |
Chemical geology |
55 |
3 |
UA library record; WoS full record; WoS citing articles |
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Vandelannoote, R.; Blommaert, W.; Sadurski, A.; Van 'T Dack, L.; Gijbels, R.; Van Grieken, R.; Bosch, B.; Leleu, M.; Rochon, J.; Sarcia, C.; Sureau, J.F.; |
Trace-elemental anomalies in surface water near a small lead-zinc mineralization at Menez-Albot (Brittany, France) |
1984 |
Journal of geochemical exploration |
20 |
4 |
UA library record; WoS full record; WoS citing articles |
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Blommaert, W.; Vandelannoote, R.; Sadurski, A.; Van 't dack, L.; Gijbels, R. |
Trace-element geochemistry of thermal water percolating through a karstic environment in the region of Saint Ghislain (Belgium) |
1983 |
Journal of volcanology and geothermal research |
19 |
2 |
UA library record; WoS full record; WoS citing articles |
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Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen |
1973 |
Analytica chimica acta |
65 |
12 |
UA library record; WoS full record; WoS citing articles |
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Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 1 : neutron and γ-ray attenuation effects |
1973 |
Analytica chimica acta |
64 |
11 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Dams, R. |
Determination of silicon in natural and pollution aerosols by 14-MeV neutron activation analysis |
1973 |
Analytica chimica acta |
63 |
16 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Internal standard activation analysis of silicon in steel |
1968 |
Analytica chimica acta |
43 |
14 |
UA library record; WoS full record; WoS citing articles |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
The determination of silicon in steel by 14-mev neutron activation analysis |
1968 |
Analytica chimica acta |
43 |
19 |
UA library record; WoS full record; WoS citing articles |
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Van 't dack, L.; Gijbels, R.; Walker, C.T. |
Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 |
2008 |
Microchimica acta |
161 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Temelkov, K.A.; Vuchkov, N.K.; Gijbels, R. |
Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry |
2007 |
Spectrochimica acta: part B : atomic spectroscopy |
62 |
28 |
UA library record; WoS full record; WoS citing articles |
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de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) |
2006 |
Applied surface science |
252 |
9 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings |
2006 |
Applied surface science |
252 |
3 |
UA library record; WoS full record; WoS citing articles |
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Kolev, I.; Bogaerts, A.; Gijbels, R. |
Influence of electron recapture by the cathode upon the discharge characteristics in dc planar magnetrons |
2005 |
Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics |
72 |
29 |
UA library record; WoS full record; WoS citing articles |
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Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. |
Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma |
2005 |
Journal of applied physics |
97 |
18 |
UA library record; WoS full record; WoS citing articles |
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Baguer, N.; Bogaerts, A.; Donko, Z.; Gijbels, R.; Sadeghi, N. |
Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements |
2005 |
Journal of applied physics |
97 |
40 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques |
2005 |
Journal of mass spectrometry |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; Möller, W.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation |
2005 |
Applied physics A : materials science & processing |
81 |
4 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films |
2005 |
Rapid communications in mass spectrometry |
19 |
24 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Okhrimovskyy, A.; Baguer, N.; Gijbels, R. |
Hollow cathode discharges with gas flow: numerical modelling for the effect on the sputtered atoms and the deposition flux |
2005 |
Plasma sources science and technology |
14 |
9 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van de Sanden, M.C.M. |
Molecular dynamics simulation of the impact behaviour of various hydrocarbon species on DLC |
2005 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms |
228 |
19 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields |
2004 |
Analytical chemistry |
76 |
67 |
UA library record; WoS full record; WoS citing articles |
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Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. |
Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> |
2004 |
Vacuum: the international journal and abstracting service for vacuum science and technology |
76 |
2 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van den Sanden, M.C.M. |
Molecular dynamics simulations for the growth of diamond-like carbon films from low kinetic energy species |
2004 |
Diamond and related materials |
13 |
53 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Calculation of cathode heating in analytical glow discharges |
2004 |
Journal of analytical atomic spectrometry |
19 |
21 |
UA library record; WoS full record; WoS citing articles |
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Okhrimovskyy, A.; Bogaerts, A.; Gijbels, R. |
Incorporating the gas flow in a numerical model of rf discharges in methane |
2004 |
Journal of applied physics |
96 |
11 |
UA library record; WoS full record; WoS citing articles |
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Depla, D.; Chen, Z.Y.; Bogaerts, A.; Ignatova, V.; de Gryse, R.; Gijbels, R. |
Modeling of the target surface modification by reactive ion implantation during magnetron sputtering |
2004 |
Journal of vacuum science and technology: A: vacuum surfaces and films |
22 |
13 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. |
Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study |
2004 |
Applied surface science |
231/232 |
4 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Gijbels, R. |
A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques |
2004 |
Applied surface science |
231/232 |
7 |
UA library record; WoS full record; WoS citing articles |
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