Abstract: High-resolution electron microscopy (HREM) studies of the microstructure and specific defects in hexagonal boron nitride (h-BN) precursors and cubic boron nitride (c-BN) crystals made under high-pressure high-temperature conditions revealed the presence of half-nanotubes at the edges of the h-BN particles. Their sp(3) bonding tendency could strongly influence the nucleation rates of c-BN. The atomic resolution at extended dislocations was insufficient to allow us to determine the stacking fault energy in the c-BN crystals. Its mean value of 191 +/- 15 mJ m(-2) is of the same order of magnitude as that of diamond. High-frequency (94 GHz) electron paramagnetic resonance studies on c-BN single crystals have produced new data on the D1 centres associated with the boron species. Ion-beam-induced luminescence measurements have indicated that c-BN is a very interesting luminescent material, which is characterized by four luminescence bands and exhibits a better resistance to ionizing radiation than CVD diamond.

Abstract: The engineering, construction, performance and running costs of a catalytic flue gas cleaning component in the low dust area of a municipal waste incinerator is discussed. For this purpose, the case study of a Flemish incineration plant is presented, covering the history, the design procedure of the catalyst, relevant process data and the financial aspects. A reliable PCDD/F-destruction by means of oxidation by the catalyst to typical values of 0.001 ng TEQ/N m3 has been demonstrated. At the same time, NOx- and CO-emissions are reduced by 90% and 20% to about 50 mg/N m3 and below 10 mg/N m3, respectively.

Abstract: We analyzed ultra-thin ZrO2/SiO2/Si gate dielectrics under post-deposition anneals in dry O-2 at temperatures from 500 to 700 degreesC. TOF-SIMS profiling of ZrO2/SiO2/Si stacks is hampered by many sputter induced artifacts. The depletion of oxygen leads to a decrease in SIMS intensities. However, preferential sputtering is accompanied by transport of the depleted species towards the surface. Due to recoil implantation oxygen gets piled-up near the ZrO2/SiO2 interface. Either normal or radiation-enhanced diffusion transports oxygen back to the surface. Simultaneously also segregation of zirconium towards and through the interface is observed, resulting in a large zirconium tail in the underlying silicon substrate. (C) 2002 Elsevier Science B.V. All rights reserved.

Abstract: Based on the existing experimental data and their statistical errors, it is not possible to make a sound recommendation of the cross-section set of Campbell et al (J. Phys. B: At. Mol. Opt. Phys. 34 (2001) 1185). We comment on this paper.

Abstract: Calibration curves with two quasi-linear sections ("double sloping'') were observed for the medium volatile elements, Cr and Cu, with the use of a SIMAA 6000 graphite furnace atomic absorption spectrometer under interrupted internal gas flow conditions. If a standard transversally heated graphite atomizer (THGA) tube was shortened by 0.5 mm at both of its ends, (i.e. the gaps were enlarged between graphite furnace housing and tube ends), a stronger declination of the calibration curves resulted. Elements with fairly high diffusion coefficients (>5.8 cm(2) s(-1)) and with short appearance time of their transients (<0.6 s), such as Cr and Cu, have shown the most characteristic sensitivity drop towards higher concentrations. This anomalous feature could be eliminated in three different ways; (1) by applying end-capped THGA tubes, (2) using mini-flow (50 cm(3) min(-1)) conditions during the atomization stage, and (3) by adding Pd-Mg chemical modifier. For the low volatile Mo and V, the calibration curves had no irregular shape. For Ag, Co, Cr, Cu, Mn and Ni, the mini-flow settings improved the linearity of the calibration curves and extended the upper limit of the linear calibration range by a factor of 1.5-2.0. The irregular characteristic of the analytical curves was interpreted as an increased vapour loss at higher analyte concentrations through the opened ends of the standard THGA tubes. This vapour loss was associated with the significantly diverse expulsion velocities of atoms, caused by the difference in temperature and concentration gradients, when evaporating amounts of analytes with more than one order of magnitude difference.

Abstract: Fourier transform laser microprobe mass spectrometry (FT LMMS) has been developed for the molecular analysis of both organic and inorganic components at the surface of microobjects with the ultimate specificity of high-mass resolution. These capabilities are needed in numerous applications of practical material analysis, such as tracing back anomalies in microobjects. The purpose of this paper is to address representative example from industrial trouble shooting, in which organic and inorganic analytes in a single microparticle have been identified unambiguously. This motivates the research to extend the methodology towards quantification. This paper deals with the fundamental aspect of information depth, specifically for inorganic molecular adduct ions. Finally, data will show the quantitative capabilities of FT LMMS. A suitable methodology for the preparation of reference specimens has allowed the empirical calibration of the response as a function of the local concentration to be achieved.