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Author Title Year Publication Volume (up) Times cited Additional Links
Nord, M.; Verbeeck, J. Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control 2019 Microscopy and microanalysis T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon 25 UA library record
Nord, M.; Verbeeck, J. Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis 2019 Microscopy And Microanalysis 25
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial 2019 Microscopy and microanalysis 25 UA library record
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage 2020 Microscopy And Microanalysis 26 4 UA library record; WoS full record; WoS citing articles
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization 2020 Microscopy And Microanalysis 26 3 UA library record; WoS full record; WoS citing articles
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. Fast electron low dose tomography for beam sensitive materials 2021 Microscopy And Microanalysis 27 UA library record
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record