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Records |
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Author |
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
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Title |
Measuring porosity at the nanoscale by quantitative electron tomography |
Type |
A1 Journal article |
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Year |
2010 |
Publication |
Nano letters |
Abbreviated Journal |
Nano Lett |
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Volume  |
10 |
Issue |
12 |
Pages |
5014-5019 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
Quantitative electron tomography is proposed to characterize porous materials at a nanoscale. To achieve reliable three-dimensional (3D) quantitative information, the influence of missing wedge artifacts and segmentation methods is investigated. We are presenting the Discrete Algebraic Reconstruction Algorithm as the most adequate tomography method to measure porosity at the nanoscale. It provides accurate 3D quantitative information, regardless the presence of a missing wedge. As an example, we applied our approach to nanovoids in La2Zr2O7 thin films. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Washington |
Editor |
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Language |
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Wos |
000284990900040 |
Publication Date |
2010-11-22 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1530-6984;1530-6992; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
12.712 |
Times cited |
79 |
Open Access |
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Notes |
Esteem 026019 |
Approved |
Most recent IF: 12.712; 2010 IF: 12.219 |
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Call Number |
UA @ lucian @ c:irua:87658 |
Serial |
1967 |
| Permanent link to this record |
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Author |
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
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Title |
DART explained: how to carry out a discrete tomography reconstruction |
Type |
P1 Proceeding |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
295-296 |
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Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
978-3-540-85154-7 |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:77914 |
Serial |
606 |
| Permanent link to this record |
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Author |
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
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Title |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
Type |
P3 Proceeding |
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Year |
2014 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
S.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:124548 |
Serial |
2866 |
| Permanent link to this record |
