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  Author Title Year Publication Volume (up) Times cited Additional Links Links
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 UA library record pdf url doi
Monai, M.; Jenkinson, K.; Melcherts, A.E.M.; Louwen, J.N.; Irmak, E.A.; Van Aert, S.; Altantzis, T.; Vogt, C.; van der Stam, W.; Duchon, T.; Smid, B.; Groeneveld, E.; Berben, P.; Bals, S.; Weckhuysen, B.M. Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis 2023 Science 380 29 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. Three-dimensional atomic imaging of crystalline nanoparticles 2011 Nature 470 341 UA library record; WoS full record; WoS citing articles pdf doi
Akamine, H.; Van den Bos, K.H.W.; Gauquelin, N.; Farjami, S.; Van Aert, S.; Schryvers, D.; Nishida, M. Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM 2015 Journal of alloys and compounds 644 12 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record pdf url doi
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques 2013 Materials science forum T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739 2 UA library record; WoS full record; WoS citing articles pdf doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images 2017 Journal of physics : conference series T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902 1 UA library record; WoS full record; WoS citing articles pdf url doi
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