Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Radtke, G.; Botton, G.A.; Verbeeck, J. |
Electron inelastic, scattering and anisotropy: the two-dimensional point of view |
2006 |
Ultramicroscopy |
106 |
5 |
UA library record; WoS full record; WoS citing articles |
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. |
Experiments on inelastic electron holography |
2006 |
Ultramicroscopy |
106 |
28 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J. |
Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring |
2006 |
Ultramicroscopy |
106 |
8 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
Model-based quantification of EELS spectra: including the fine structure |
2006 |
Ultramicroscopy |
106 |
38 |
UA library record; WoS full record; WoS citing articles |
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. |
Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy |
2006 |
Ultramicroscopy |
106 |
83 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Kilaas, R.; Kisielowski, C. |
Nonlinear imaging using annular dark field TEM |
2005 |
Ultramicroscopy |
104 |
15 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
2003 |
Ultramicroscopy |
98 |
26 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects |
1994 |
Ultramicroscopy |
54 |
59 |
UA library record; WoS full record; WoS citing articles |
Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
Structures and phase transitions in C60 and C70 fullerites |
1993 |
Ultramicroscopy |
51 |
17 |
UA library record; WoS full record; WoS citing articles |
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
Milat, O.; Van Tendeloo, G.; Amelinckx, S. |
Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures |
1992 |
Ultramicroscopy |
41 |
5 |
UA library record; WoS full record; WoS citing articles |
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
Ultramicroscopy |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |