NANOlab Center of Excellence literature database -- Query Results

	NANOlab Center of Excellence literature database Home \| Show All \| Simple Search \| Advanced Search	Login Quick Search: Field: contains: ...
	31–60 of 180 records found matching your query (RSS \| history):

Select All Deselect All

<< 1 2 3 4 5 6 >>

List View

Citations

Details

Author	Title	Year	Publication	Volume	Times cited	Additional Links
van Landuyt, J.; Vanhellemont, J.	High-resolution electron microscopy for semiconducting materials science	1994				UA library record
Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J.	In situ HREM study of electron irradiation effects in AgCl microcrystals	1992				UA library record
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation	1997				UA library record
van Landuyt, J.; Kuypers, S.; van Heurck, C.; Van Tendeloo, G.; Amelinckx, S.	Methods of structural analysis of modulated structures and quasicrystals	1993				UA library record
van Landuyt, J.; van Bockstael, M.H.G.; van Royen, J.	Microscopy of gemmological materials	1997			4	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R.	A temperature study of mixed AgBr-AgBrI tabular crystals	1995			3	UA library record; WoS full record; WoS citing articles
Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J.	Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy	1992	Dentistry in Japan	29		UA library record
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Tanner, L.E.	HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys	1994	Icem	13		UA library record
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.	HREM study of Rb₆C₆₀ and helical carbon nanotubules	1994	Icem	13		UA library record
Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J.	Ion beam synthesis of β-SiC at 950⁰C and structural characterization	1996	Nuclear instruments and methods in physics research	B112		UA library record
Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A.	Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope	1995	Materials science and technology	11	7	UA library record; WoS full record; WoS citing articles
van Landuyt, J.	Een tempel voor elektronenmicroscopie “kijken naar atomen”	1998	Fonds informatief	38		UA library record
Schryvers, D.; Van Landuyt, J.	Electron microscopy study of twin sequences and branching in NissAl34 3R martensite	1992	ICOMAT
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J.	A 2a2b3c superstructure in hexagonal NiS_1-x: a study by means of electron diffraction and HREM	1993	Journal of crystal growth	126	4	UA library record; WoS full record; WoS citing articles
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J.	A 2a2a3c superstructure in hexagonal Ni_1-xS : a study by means of electron-diffraction and HRTEM	1993	Journal of crystal growth	126	4	UA library record; WoS full record; WoS citing articles
Cassiers, K.; van der Voort, P.; Linssen, T.; Vansant, E.F.; Lebedev, O.; van Landuyt, J.	A counterion-catalyzed (S⁰H⁺)(X^-I⁺) pathway toward heat- and steam-stable mesostructured silica assembled from amines in acidic conditions	2003	The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical	107	9	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.	A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon	2003	Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK	340	4	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared absorption measurement of interstitial and precipitated oxygen in p⁺ silicon wafers	1999	Microelectronic engineering	45		UA library record; WoS full record
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon	1999	The review of scientific instruments	70	5	UA library record; WoS full record; WoS citing articles
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J.	Carbon nano-tubes: their formation process and observation by electron microscopy	1993	Journal of crystal growth	130	190	UA library record; WoS full record; WoS citing articles
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.	Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation	2001	Institute of physics conference series			UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R.	Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry	1991	Journal of crystal growth	110	40	UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A.	Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas	1997	Journal of crystal growth	173	4	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C.	Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy	2004	Journal of the electrochemical society	151	13	UA library record; WoS full record; WoS citing articles
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S.	Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy	2001	Materials science in semiconductor processing	4		UA library record; WoS full record
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E.	Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM	2001	Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY	308	3	UA library record; WoS full record; WoS citing articles
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G.	The chirality of carbon nanotubules determined by dark-field electron microscopy	1996	Philosophical magazine: A: physics of condensed matter: defects and mechanical properties	74	20	UA library record; WoS full record; WoS citing articles
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Clustering of vacancies on {113} planes in Si layers close to Si-Si₃N₄ interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation	1999	Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D.	Colloid size distributions in ion implanted glass	1993	Journal of non-crystalline solids	162	63	UA library record; WoS full record; WoS citing articles
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R.	A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals	1996	The journal of imaging science and technology	40	4	UA library record; WoS full record; WoS citing articles