| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. |
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers |
1999 |
Thin solid films : an international journal on the science and technology of thin and thick films |
343/344 |
1 |
UA library record; WoS full record; WoS citing articles |
| Herrebout, D.; Bogaerts, A.; Gijbels, R. |
Modelleren van plasmas gebruikt voor de afzetting van dunne lagen |
2004 |
Chemie magazine |
|
|
UA library record |
| Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten |
2004 |
Chemie magazine |
|
|
UA library record |
| Vandelannoote, R.; Blommaert, W.; van Grieken, R.; Gijbels, R. |
L'analyse des eaux géothermales par spectrométrie de masse à étincelles |
1979 |
Spectra 2000: la revue de l'instrumentation |
53 |
|
UA library record |
| Vandelannoote, R.; Blommaert, W.; Gijbels, R.; van Grieken, R. |
Analysis of geothermal waters by spark source mass spectrometry |
1981 |
Fresenius' Zeitschrift für analytische Chemie |
309 |
8 |
UA library record |
| Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
| Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
| Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
| Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds |
1996 |
Comptes rendus de l'Académie bulgare des sciences |
49 |
|
UA library record |
| Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
| Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
| Gijbels, R.; Bogaerts, A. |
Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations |
1997 |
Spectroscopy |
9 |
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling of glow discharges: what can we learn from it? |
1997 |
Analytical chemistry A-pages |
69 |
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling of radio-frequency and direct current glow discharges in argon |
2000 |
Journal of technical physics |
41 |
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
| Blommaert, W.; Vandelannoote, R.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Relative evaluation of neutron activation, X-ray fluorescence and spark source mass spectrometry for multi-element analysis of geothermal waters |
1980 |
Journal of radioanalytical chemistry |
57 |
|
UA library record |
| van Straaten, M.; Vertes, A.; Gijbels, R. |
Sample erosion studies in a glow discharge ionization cell |
1991 |
Spectrochimica acta |
46b |
|
UA library record |
| Vandelannoote, R.; Blommaert, W.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Statistical grouping and controlling factors of dissolved trace elements in a surface water system |
1983 |
Environmental technology letters |
4 |
1 |
UA library record |
| Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Structural analysis of silver halide cubic microcrystals with epitaxial or conversion growths by STEM-EDX |
1992 |
Mikrochimica acta: supplementum |
12 |
|
UA library record |
| Pentcheva, E.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Sur les processus, controlant le caractère hydrochimique des eaux thermales profondes (Bulgarie Méridionale) |
1991 |
Comptes rendus de l'Académie bulgare des sciences |
44 |
|
UA library record |
| Vandelannoote, R.; Van 't dack, L.; Gijbels, R. |
Trace element and micro-mineral composition of some selected anhydrite samples from the Saint Ghislain drill hole (Hainaut, Belgium) |
1986 |
Bulletin van de Belgische Vereniging voor Geologie |
95 |
|
UA library record |
| Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R. |
Comment on 'Integral cross sections for electron impact excitation of electronic states of N2' |
2002 |
Journal of physics: B : atomic and molecular physics |
35 |
2 |
UA library record; WoS full record; WoS citing articles |
| Van 't dack, L.; Gijbels, R.; Walker, C.T. |
Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 |
2008 |
Microchimica acta |
161 |
1 |
UA library record; WoS full record; WoS citing articles |
| de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
|
|
|
UA library record; WoS full record; |
| Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
| Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Investigation of the electron distribution functions in low pressure electron cyclotron resonance discharges |
1999 |
|
|
|
UA library record; WoS full record; |
| Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
