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Title
Year
Publication
Volume
Times cited
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Montoya, E.
;
Bals, S.
;
Rossell, M.D.
;
Schryvers, D.
;
Van Tendeloo, G.
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis
2007
Microscopy research and technique
70
36
UA library record
;
WoS full record
;
WoS citing articles