Records |
Author |
Van Grieken, R.; Kontozova, V.; Godoi, R.H.M.; Spolnik, Z.; Worobiec, A.; Deutsch, F.; Bencs, L. |
Title |
Some studies of the effect of indoor and outdoor pollutants on cultural heritage items |
Type |
P3 Proceeding |
Year |
2005 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP) |
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no |
Call Number |
UA @ admin @ c:irua:57632 |
Serial |
8556 |
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Author |
Török, S.; Szandor, S.; Xhoffer, C.; Van Grieken, R. |
Title |
Source apportionment of individual aerosol particles at Hungarian background stations |
Type |
H3 Book chapter |
Year |
1993 |
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Volume |
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Issue |
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Pages |
32-331
T2 - Photo-oxidants: precursors and product |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:6265 |
Serial |
8559 |
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Author |
Vos, L.; Van Grieken, R. |
Title |
Spark source mass spectrometry for trace analysis of diverse biological matrices |
Type |
H3 Book chapter |
Year |
1983 |
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Volume |
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Issue |
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Pages |
303-306
T2 - Mass spectrometry advances 1982 / Sch |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:117486 |
Serial |
8564 |
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Author |
Bencs, L.; Ravindra, K.; Van Grieken, R. |
Title |
Spatial and temporal variation of anthropogenic palladium in the environment |
Type |
H3 Book chapter |
Year |
2006 |
Publication |
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Volume |
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Issue |
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Pages |
433-454
T2 - Palladium emissions in the environmen |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:54922 |
Serial |
8565 |
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Author |
Ravindra, K.; Wauters, E.; Van Grieken, R. |
Title |
Spatial and temporal variations in particulate Polycyclic Aromatic Hydrocarbon (PAH) levels over Menen (Belgium) and their relation with air mass trajectories |
Type |
H3 Book chapter |
Year |
2007 |
Publication |
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Volume |
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Issue |
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Pages |
838-841
T2 - Air pollution modeling and its applic |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:65571 |
Serial |
8566 |
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Author |
Bruynseels, F.; Van Grieken, R. |
Title |
Speciation and distribution of sulfur and nitrogen in individual aerosol particles measured by LAMMA |
Type |
P3 Proceeding |
Year |
1984 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:117494 |
Serial |
8568 |
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Author |
Szalóki, I.; Ro, C.-U.; Osán, J.; de Hoog, J.; Van Grieken, R. |
Title |
Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry |
Type |
H3 Book chapter |
Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
569-592
T2 - X-ray spectrometry: recent technologi |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:43878 |
Serial |
8570 |
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Author |
Injuk, J.; Van Grieken, R.; Blank, A.; Eksperiandova, L.; Buhrke, V. |
Title |
Specimen preparation |
Type |
H3 Book chapter |
Year |
2006 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
411-432
T2 - Handbook of practical X-ray fluoresce |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:58854 |
Serial |
8573 |
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Author |
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Title |
Spectrocopic coincidence experiment in transmission electron microscopy |
Type |
Dataset |
Year |
2019 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
Dataset; Electron microscopy for materials research (EMAT) |
Abstract |
This dataset contains individual EEL and EDX events where for every event (electron or X-ray), their energy and time of arrival is stored. The experiment was performed in a transmission electron microscope (Tecnai Osiris) at 200 keV. The material investigated is an Al-Mg-Si-Cu alloy. The 'full_dataset.mat' contains the full dataset and the 'subset.mat' has the first five frames of the full dataset. The attached 'EELS-EDX.ipynb' is a jupyter notebook file. This file describes the data processing in order to observe the temporal correlation between the electrons and X-rays. |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:169112 |
Serial |
6888 |
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Author |
van Espen, P.; Janssens, K. |
Title |
Spectrum evaluation |
Type |
H3 Book chapter |
Year |
1992 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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chapter 4 |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:2809 |
Serial |
5842 |
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Author |
Vanherck, J. |
Title |
Spontaneous and induced magnetisation in two-dimensional and bulk Heisenberg ferromagnets : a quantum mechanical treatment |
Type |
Doctoral thesis |
Year |
2020 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
160 p. |
Keywords |
Doctoral thesis; Condensed Matter Theory (CMT) |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:171875 |
Serial |
6612 |
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Author |
Elmonov, A.A.; Yusupov, M.S.; Dzhurakhalov, A.A.; Bogaerts, A. |
Title |
Sputtering of Si(001) and SiC(001) by grazing ion bombardment |
Type |
P1 Proceeding |
Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
209-213 |
Keywords |
P1 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
The peculiarities of sputtering processes at 0.5-5 keV Ne grazing ion bombardment of Si(001) and SiC(001) surfaces and their possible application for the surface modification have been studied by computer simulation. Sputtering yields in the primary knock-on recoil atoms regime versus the initial energy of incident ions (E(0) = 0.5-5 keV) and angle of incidence (psi = 0-30 degrees) counted from a target surface have been calculated. Comparative studies of layer-by-layer sputtering for Si(001) and SiC(001) surfaces versus the initial energy of incident ions as well as an effective sputtering and sputtering threshold are discussed. |
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0000-00-00 |
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Series Issue |
84 |
Edition |
|
ISSN |
978-86-80019-27-7 |
ISBN |
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Additional Links |
UA library record; WoS full record; |
Impact Factor |
|
Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:95704 |
Serial |
3112 |
Permanent link to this record |
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Author |
Salbu, B.; Janssens, K.; Lind, O.C.; Simionovici, A.S.; Trekling, T.; Drakopoulos, M.; Snigireva, I.; Snigirev, A. |
Title |
SR-based X-ray microbeam techniques utilised for solid-state speciation of U in fuel particles |
Type |
P3 Proceeding |
Year |
2002 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:39943 |
Serial |
5844 |
Permanent link to this record |
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Author |
Zhang, Q.; Vlaeminck, S.E.; DeBarbadillo, C.; Suzuki, R.; Kharkar, S.M.; Al-Omari, A.; Wett, B.; Chandran, K.; Murthy, S.; De Clippeleir, H. |
Title |
Startup strategies of deammonification reactors treating reject water from thermally hydrolyzed solids |
Type |
P3 Proceeding |
Year |
2017 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
|
Pages |
5 p.
T2 - WEFTEC.17, 30 September 4 October 2017, |
Keywords |
P3 Proceeding; Engineering sciences. Technology; Sustainable Energy, Air and Water Technology (DuEL) |
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Edition |
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ISBN |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:151113 |
Serial |
8579 |
Permanent link to this record |
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Author |
Playford, K.; Colin, J.L.; Pacyna, J.M.; Pirrone, N.; Schulz, M.; Van Grieken, R.; Wrembel, Z. |
Title |
State-of-the-art and research needs for trace metals |
Type |
H3 Book chapter |
Year |
1998 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
7-11
T2 - Sea-air exchange: processes and modellin |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Series Title |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:20972 |
Serial |
8580 |
Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Title |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
Type |
H1 Book chapter |
Year |
2004 |
Publication |
|
Abbreviated Journal |
Adv Imag Elect Phys |
Volume |
|
Issue |
|
Pages |
1-164 |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Academic Press |
Place of Publication |
San Diego, Calif. |
Editor |
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Language |
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Wos |
000223226700001 |
Publication Date |
2011-01-05 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
ISSN |
1076-5670; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:47513 |
Serial |
3156 |
Permanent link to this record |
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|
Author |
Van Aert, S. |
Title |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
Type |
H1 Book chapter |
Year |
2012 |
Publication |
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Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
281-309 |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Wiley-VCH |
Place of Publication |
Weinheim |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978-3-527-31706-6 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
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Open Access |
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Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:96693 |
Serial |
3159 |
Permanent link to this record |
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|
Author |
Egoavil, R. |
Title |
STEM investigation of complex oxides at the atomic scale |
Type |
Doctoral thesis |
Year |
2014 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
Doctoral thesis; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Antwerpen |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
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Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:123302 |
Serial |
3160 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Stof : begrippen, bronnen en analysmethoden |
Type |
P3 Proceeding |
Year |
1985 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:117501 |
Serial |
8582 |
Permanent link to this record |
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|
|
Author |
Prabhakara, V. |
Title |
Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy |
Type |
Doctoral thesis |
Year |
2021 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
149 p. |
Keywords |
Doctoral thesis; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
Abstract |
Scaling down the size of transistors has been a trend for several decades which has led to improved transistor performance, increased transistor density and hence the overall computation power of IC chips. The trend slowed in recent years due to reliability and power consumption issues at the nanoscale. Hence strain is introduced into transistor channels that has beneficial effects on improving the mobility of charge carriers, providing an alternative pathway for enhancing transistor performance. Therefore, monitoring strain is vital for the semiconductor industry. With the recent trend of decreasing device dimensions (FinFETS ~ 10-20nm) and strain modulation being used throughout, industry needs a reliable and fast method as quality control or defect characterisation. Such a universal strain measurement method does not exist, and one relies on a combination of quantitative in-line methods and complex off-line approaches. In this thesis, I investigated TEM and Raman spectroscopy-based methodologies for strain measurement. In terms of TEM methodologies, advancements are made for the STEM moiré imaging, targeting strain spatial resolution enhancement. I introduce advanced quadrature demodulation and phase stepping interferometry applied to STEM moiré that greatly enhances the spatial resolution while providing enhanced field of view and sensitivity for strain measurement. We introduce ways to reduce scan distortions in strain maps using an alternative scan strategy called “Block scanning” and the non-linear regression applied for strain extraction. Prospects for 3D strain analysis using high-resolution tomography is also investigated which gives direct access for the full second order strain tensors calculation. Finally, we compare strain measurements from TEM techniques with inline techniques like Raman spectroscopy. Raman stress measurement involves sensitive identification of the TO and LO phonon peaks. Raman spectrum of strained Ge transistor channel consists of strongly overlapping peaks within the spectral resolution of the spectrometer. Hence, the process of deconvolution of the two peaks is rather challenging. Hence, we explore new polarisation geometries like radially polarised incoming light which was shown to ease the deconvolution problem resulting in improved precision for Raman stress–strain measurements. |
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UA @ admin @ c:irua:182261 |
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6847 |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
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H3 Book chapter |
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2000 |
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201-202 |
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H3 Book chapter; Electron microscopy for materials research (EMAT) |
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0000-00-00 |
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Most recent IF: NA |
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UA @ lucian @ c:irua:54731 |
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3173 |
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Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
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Stress analysis with convergent beam electron diffraction around NMOS transistors |
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P1 Proceeding |
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2001 |
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359-360 |
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P1 Proceeding; Electron microscopy for materials research (EMAT); Internet Data Lab (IDLab) |
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Princeton University Press |
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Princeton, N.J. |
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0000-00-00 |
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1-58949-003-7 |
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UA @ lucian @ c:irua:95736 |
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3176 |
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Nasr Esfahani, D. |
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Strongly correlated electronic systems : influence of electric field and doping |
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Doctoral thesis |
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2014 |
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Doctoral thesis; Condensed Matter Theory (CMT) |
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Antwerpen |
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0000-00-00 |
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UA @ lucian @ c:irua:118557 |
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3186 |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
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Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
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H3 Book chapter |
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1998 |
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317-323 |
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H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Antwerp |
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UA @ lucian @ c:irua:24914 |
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3191 |
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Bernaerts, D.; Amelinckx, S.; Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J. |
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Structural aspects of carbon nanotubes |
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P3 Proceeding |
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1995 |
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551-555 |
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P3 Proceeding; Electron microscopy for materials research (EMAT) |
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World Scientific |
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Singapore |
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0000-00-00 |
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UA @ lucian @ c:irua:13295 |
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3206 |
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Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
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Structural changes in fluorinated T{'} and T* phases |
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P3 Proceeding |
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2000 |
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193-194 |
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P3 Proceeding; Electron microscopy for materials research (EMAT) |
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s.l. |
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UA @ lucian @ c:irua:36044 |
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3212 |
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van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
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Structural characterization of organic molecules by laser mass spectrometry |
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1993 |
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177-319 |
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H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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New York |
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UA @ lucian @ c:irua:6124 |
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3222 |
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Injuk, J.; de Bock, L.; Van Grieken, R. |
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Structural heterogeneity within airborne particles |
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1998 |
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173-202
T2 - Atmospheric particles / Harrison, R.M |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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UA @ admin @ c:irua:20969 |
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8586 |
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Van Tendeloo, G.; Schryvers, D.; Tanner, L.E. |
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Structural instabilities associated with phase transitions: an electron microscopy study |
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P3 Proceeding |
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1992 |
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107-113 |
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P3 Proceeding; Electron microscopy for materials research (EMAT) |
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Elsevier Applied Science |
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London |
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A1992BW88A00010 |
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UA @ lucian @ c:irua:4447 |
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3238 |
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Lebedev, O.; Verbeeck, J.; Van Tendeloo, G.; Shapoval, O.; Belenchuk, A.; Moshnyaga, V.; Damaschke, B.; Samwer, K. |
Title |
Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film |
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H3 Book chapter |
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2002 |
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1013-1014 |
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H3 Book chapter; Electron microscopy for materials research (EMAT) |
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s.l. |
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UA @ lucian @ c:irua:54843 |
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3248 |
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