| Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. |
The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements |
2015 |
Microscopy and microanalysis |
21 |
15 |
UA library record; WoS full record; WoS citing articles |
| De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
| Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
| Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. |
Towards quantitative EDX results in 3 dimensions |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
| Nord, M.; Verbeeck, J. |
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control |
2019 |
Microscopy and microanalysis
T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon |
25 |
|
UA library record |
| Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
| Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. |
Wet-STEM tomography : principles, potentialities and limitations |
2014 |
Microscopy and microanalysis |
20 |
9 |
UA library record; WoS full record; WoS citing articles |
