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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images”. Fatermans J, den Dekker A J, Müller-Caspary K, Lobato I, O’Leary C M, Nellist P D, Van Aert S, Physical review letters 121, 056101 (2018). http://doi.org/10.1103/PhysRevLett.121.056101
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Nature of the Positron State in CdSe Quantum Dots”. Shi W, Callewaert V, Barbiellini B, Saniz R, Butterling M, Egger W, Dickmann M, Hugenschmidt C, Shakeri B, Meulenberg R W, Brück E, Partoens B, Bansil A, Eijt SW H, Physical review letters 121, 057401 (2018). http://doi.org/10.1103/PhysRevLett.121.057401
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Reply to Rinn and Maass”. Schweigert IV, Schweigert VA, Peeters FM, Physical review letters 86, 4712 (2001). http://doi.org/10.1103/PhysRevLett.86.4712
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Hall magnetocapitance in two-dimensional electron systems”. Valkering AMC, Sommerfeld PKH, van de Ven RAM, van der Heijden RW, Blom FAP, Lea MJ, Peeters FM, Physical review letters 81, 5398 (1998). http://doi.org/10.1103/PhysRevLett.81.5398
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Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy”. Van Aert S, De Backer A, Jones L, Martinez GT, Béché, A, Nellist PD, Physical review letters 122, 066101 (2019). http://doi.org/10.1103/PhysRevLett.122.066101
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2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy : reply”. Tan H, Turner S, Yucelen E, Verbeeck J, Van Tendeloo G, Physical review letters 108, 259702 (2012). http://doi.org/10.1103/PHYSREVLETT.108.259702
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Novel commensurability effects in superconducting films with antidot arrays”. Berdiyorov GR, Milošević, MV, Peeters FM, Physical review letters 96, 1 (2006)
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Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy”. De wael A, De Backer A, Jones L, Varambhia A, Nellist PD, Van Aert S, Physical Review Letters 124, 106105 (2020). http://doi.org/10.1103/PhysRevLett.124.106105
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Secondary-Phase-Assisted Grain Boundary Migration in CuInSe2”. Li C, Sanli ES, Barragan-Yani D, Stange H, Heinemann M-D, Greiner D, Sigle W, Mainz R, Albe K, Abou-Ras D, van Aken P A, Physical Review Letters 124, 095702 (2020). http://doi.org/10.1103/PhysRevLett.124.095702
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