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Author |
Guttmann, P.; Bittencourt, C.; Rehbein, S.; Umek, P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Schneider, G. |
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Title |
Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM |
Type |
A1 Journal article |
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Year |
2012 |
Publication |
Nature photonics |
Abbreviated Journal |
Nat Photonics |
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Volume |
6 |
Issue |
1 |
Pages |
25-29 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Near-edge X-ray absorption spectroscopy (NEXAFS)1 is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures2, 3. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/ΔE = 1 × 104 with a spatial resolution of 25 nm in a field of view of 1520 µm and a data acquisition time of ~1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies. |
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Wos |
000298416200011 |
Publication Date |
2011-11-25 |
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Series Issue |
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ISSN |
1749-4885;1749-4893; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
37.852 |
Times cited  |
76 |
Open Access |
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Notes |
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Approved |
Most recent IF: 37.852; 2012 IF: 27.254 |
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Call Number |
UA @ lucian @ c:irua:94198 |
Serial |
2272 |
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Author |
Bittencourt, C.; Felten, A.; Ghijsen, J.; Pireaux, J.-J.; Drube, W.; Erni, R.; Van Tendeloo, G. |
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Title |
Decorating carbon nanotubes with nickel nanoparticles |
Type |
A1 Journal article |
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Year |
2007 |
Publication |
Chemical physics letters |
Abbreviated Journal |
Chem Phys Lett |
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Volume |
436 |
Issue |
4/6 |
Pages |
368-372 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Place of Publication |
Amsterdam |
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Wos |
000245302000013 |
Publication Date |
2007-01-28 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0009-2614; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.815 |
Times cited |
78 |
Open Access |
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Notes |
Ia-Sfs; Pai 5/1 |
Approved |
Most recent IF: 1.815; 2007 IF: 2.207 |
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Call Number |
UA @ lucian @ c:irua:64310 |
Serial |
611 |
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Author |
Quintana, M.; Montellano, A.; Esau del Rio Castillo, A.; Van Tendeloo, G.; Bittencourt, C.; Prato, M. |
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Title |
Selective organic functionalization of graphene bulk or graphene edges |
Type |
A1 Journal article |
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Year |
2011 |
Publication |
Chemical communications |
Abbreviated Journal |
Chem Commun |
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Volume |
47 |
Issue |
33 |
Pages |
9330-9332 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Graphene sheets have been functionalized with a PAMAM dendron, finding that graphene can be efficiently functionalized all over the surface, or only at the edges, depending on the reactions used in the functionalization process. |
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Place of Publication |
London |
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Wos |
000293648200010 |
Publication Date |
2011-07-20 |
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ISSN |
1359-7345;1364-548X; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
6.319 |
Times cited |
84 |
Open Access |
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Notes |
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Most recent IF: 6.319; 2011 IF: 6.169 |
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Call Number |
UA @ lucian @ c:irua:91892 |
Serial |
2968 |
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Author |
Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. |
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Title |
Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing |
Type |
A1 Journal article |
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Year |
2007 |
Publication |
Thin solid films : an international journal on the science and technology of thin and thick films |
Abbreviated Journal |
Thin Solid Films |
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Volume |
515 |
Issue |
23 |
Pages |
8322-8327 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Publisher |
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Place of Publication |
Amsterdam : Elsevier |
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Wos |
000250353700005 |
Publication Date |
2007-03-19 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0040-6090; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.879 |
Times cited |
86 |
Open Access |
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Notes |
Pai 5/1 |
Approved |
Most recent IF: 1.879; 2007 IF: 1.693 |
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Call Number |
UA @ lucian @ c:irua:66631 |
Serial |
2008 |
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