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Author Title Year Publication Volume Times cited (up) Additional Links
van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source 2000 European mass spectrometry 6 10 UA library record; WoS full record; WoS citing articles
Lenaerts, J.; van Vaeck, L.; Gijbels, R. Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry 2003 Rapid communications in mass spectrometry 17 10 UA library record; WoS full record; WoS citing articles
Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry 1996 Rapid communications in mass spectrometry 10 11 UA library record; WoS full record; WoS citing articles
Struyf, H.; van Roy, W.; van Vaeck, L.; van Grieken, R.; Gijbels, R.; Caravatti, P. Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis 1993 Analytica chimica acta 283 17 UA library record; WoS full record; WoS citing articles
van Ham, R.; Adriaens, A.; van Vaeck, L.; Gijbels, R.; Adams, F. Molecular information in static SIMS for the speciation of inorganic compounds 2000 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 161/163 19 UA library record; WoS full record; WoS citing articles
Poels, K.; van Vaeck, L.; Gijbels, R. Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry 1998 Analytical chemistry 70 32 UA library record; WoS full record; WoS citing articles
van Vaeck, L.; Adriaens, A.; Gijbels, R. Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation 1999 Mass spectrometry reviews 18 112 UA library record; WoS full record; WoS citing articles