| |
Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goris, B.; van den Broek, W.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. |
Electron tomography based on a total variation minimization reconstruction technique |
2012 |
Ultramicroscopy |
113 |
171 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. |
3D imaging of nanomaterials by discrete tomography |
2009 |
Ultramicroscopy |
109 |
220 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. |
Oxidation state and chemical shift investigation in transition metal oxides by EELS |
2012 |
Ultramicroscopy |
116 |
413 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography |
2015 |
Ultramicroscopy |
157 |
562 |
UA library record; WoS full record; WoS citing articles |
|
