|
Author |
Title |
Year |
Publication |
Volume |
Times cited ![sorted by Times cited field, descending order (down)](img/sort_desc.gif) |
Additional Links |
Links |
|
Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. |
Transmission electron microscopy of NdNiO3 thin films on silicon substrates |
2000 |
European physical journal: applied physics |
12 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M. |
Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques |
2006 |
International journal of materials research |
97 |
1 |
UA library record; WoS full record; WoS citing articles |
|