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Radi, A.; Khalil-Allafi, J.; Etminanfar, M.R.; Pourbabak, S.; Schryvers, D.; Amin-Ahmadi, B. |
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Title |
Influence of stress aging process on variants of nano-N4Ti3precipitates and martensitic transformation temperatures in NiTi shape memory alloy |
Type |
A1 Journal article |
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Year |
2018 |
Publication |
Materials & design |
Abbreviated Journal |
Mater Design |
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Volume |
262 |
Issue |
262 |
Pages |
74-81 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
In this study, the effect of a stress aging process on the microstructure and martensitic phase transformation of NiTi shape memory alloy has been investigated. NiTi samples were aged at 450 degrees C for 1 h and 5 h under different levels of external tensile stress of 15, 60 and 150 MPa. Transmission electron microscopy (TEM) was used to characterize different variants and morphology of precipitates. The results show that application of all stress levels restricts the formation of precipitates variants in the microstructure after I h stress aging process. However, all variants can be detected by prolonging aging time to 5 h at 15 MPa stress level and the variants formation is again restricted by increasing the stress level. Moreover, the stress aging process resulted in changing the shape of precipitates in comparison with that of the stress-free aged samples. Coffee-bean shaped morphologies were detected for precipitates in all stress levels. According to the Differential Scanning Calorimetry (DSC) results, the martensite start temperature (M-s) on cooling shifts to higher temperatures with increasing the tensile stress during the aging process. This can be related to the change ofaustenite to martensite interface energy due to the different volume fractions and variants of precipitates. (c) 2018 Elsevier Ltd. All rights reserved. |
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Publication Date |
2018-01-04 |
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ISSN |
0264-1275 |
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UA library record; ; WoS full record; WoS citing articles |
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Impact Factor |
4.364 |
Times cited  |
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Open Access |
OpenAccess |
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Most recent IF: 4.364 |
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Call Number |
UA @ lucian @ c:irua:149854 |
Serial |
4938 |
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Author |
Macke, S.; Radi, A.; Hamann-Borrero, J.E.; Verna, A.; Bluschke, M.; Brück, S.; Goering, E.; Sutarto, R.; He, F.; Cristiani, G.; Wu, M.; Benckiser, E.; Habermeier, H.-U.; Logvenov, G.; Gauquelin, N.; Botton, G.A; Kajdos, A.P.; Stemmer, S.; Sawatzky,G.A.; Haverkort, M.W.; Keimer, B.; Hinkov, V. |
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Title |
Element Specific Monolayer Depth Profiling |
Type |
A1 Journal Article |
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Year |
2014 |
Publication |
Advanced Materials |
Abbreviated Journal |
Adv Mater |
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Volume |
26 |
Issue |
38 |
Pages |
6554-6559 |
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Keywords |
A1 Journal Article; Electron Microscopy for Materials Science (EMAT) |
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Abstract |
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers. |
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000343763200004 |
Publication Date |
2014-08-08 |
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ISSN |
1521-4095 |
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Impact Factor |
19.791 |
Times cited |
34 |
Open Access |
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Most recent IF: 19.791; 2014 IF: NA |
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Call Number |
EMAT @ emat @ |
Serial |
4541 |
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