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Title
Year
Publication
Volume
Times cited
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Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
van Dyck, D.
;
Chen, J.H.
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example
2005
Ultramicroscopy
104
37
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