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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Şentürk, DG.
;
Yu, CP.
;
De Backer, A.
;
Van Aert, S.
Atom counting from a combination of two ADF STEM images
2024
Ultramicroscopy
255
UA library record
;
WoS full record
;
WoS citing articles
Van den Broek, W.
;
Jannis, D.
;
Verbeeck, J.
Convexity constraints on linear background models for electron energy-loss spectra
2023
Ultramicroscopy
254
UA library record
Şentürk, D.G.
;
De Backer, A.
;
Van Aert, S.
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination
2024
Ultramicroscopy
259
UA library record
