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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Zhao, S.-X.; Zhang, Y.-R.; Gao, F.; Wang, Y.-N.; Bogaerts, A. |
Bulk plasma fragmentation in a C4F8 inductively coupled plasma : a hybrid modelling study |
2015 |
Journal of applied physics |
117 |
11 |
UA library record; WoS full record; WoS citing articles |
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|
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Bogaerts, A.; Gijbels, R. |
Calculation of cathode heating in analytical glow discharges |
2004 |
Journal of analytical atomic spectrometry |
19 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Calculation of crater profiles on a flat cathode in a direct current glow discharge, and comparison with experiment |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
42 |
UA library record; WoS full record; WoS citing articles |
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|
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Kolev, I.; Bogaerts, A. |
Calculation of gas heating in a dc sputter magnetron |
2008 |
Journal of applied physics |
104 |
19 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Gijbels, R.; Serikov, V.V. |
Calculation of gas heating in direct current argon glow discharges |
2000 |
Journal of applied physics |
87 |
63 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Temelkov, K.A.; Vuchkov, N.K.; Gijbels, R. |
Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry |
2007 |
Spectrochimica acta: part B : atomic spectroscopy |
62 |
28 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Okhrimovskyy, A.; Gijbels, R. |
Calculation of the gas flow and its effect on the plasma characteristics for a modified Grimm-type glow discharge cell |
2002 |
Journal of analytical atomic spectrometry |
17 |
39 |
UA library record; WoS full record; WoS citing articles |
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Adams, F.; Adriaens, A.; Bogaerts, A. |
Can plasma spectrochemistry assist in improving the accuracy of chemical analysis? |
2002 |
Analytica chimica acta |
456 |
6 |
UA library record; WoS full record; WoS citing articles |
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Khalilov, U.; Neyts, E.C.; Pourtois, G.; van Duin, A.C.T. |
Can we control the thickness of ultrathin silica layers by hyperthermal silicon oxidation at room temperature? |
2011 |
The journal of physical chemistry: C : nanomaterials and interfaces |
115 |
36 |
UA library record; WoS full record; WoS citing articles |
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Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids |
2002 |
Vacuum |
69 |
4 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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Xu, X.; Vereecke, G.; Chen, C.; Pourtois, G.; Armini, S.; Verellen, N.; Tsai, W.K.; Kim, D.W.; Lee, E.; Lin, C.Y.; Van Dorpe, P.; Struyf, H.; Holsteyns, F.; Moshchalkov, V.; Indekeu, J.; De Gendt, S.; |
Capturing wetting states in nanopatterned silicon |
2014 |
ACS nano |
8 |
39 |
UA library record; WoS full record; WoS citing articles |
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Kosimov, D.P.; Dzhurakhalov, A.A.; Peeters, F.M. |
Carbon clusters: from ring structures to nanographene |
2010 |
Physical review : B : condensed matter and materials physics |
81 |
55 |
UA library record; WoS full record; WoS citing articles |
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Aerts, R.; Somers, W.; Bogaerts, A. |
Carbon dioxide splitting in a dielectric barrier discharge plasma : a combined experimental and computational study |
2015 |
Chemsuschem |
8 |
131 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.C.; Shibuta, Y.; van Duin, A.C.T.; Bogaerts, A. |
Catalyzed growth of carbon nanotube with definable chirality by hybrid molecular dynamics-force biased Monte Carlo simulations |
2010 |
ACS nano |
4 |
129 |
UA library record; WoS full record; WoS citing articles |
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Neyts, E.C.; van Duin, A.C.T.; Bogaerts, A. |
Changing chirality during single-walled carbon nanotube growth : a reactive molecular dynamics/Monte Carlo study |
2011 |
Journal of the American Chemical Society |
133 |
116 |
UA library record; WoS full record; WoS citing articles |
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Bultinck, E.; Bogaerts, A. |
Characterization of an Ar/O2 magnetron plasma by a multi-species Monte Carlo model |
2011 |
Plasma sources science and technology |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. |
Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis |
1995 |
Microscopy, microanalysis, microstructures |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
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Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. |
Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition |
2009 |
Materials Research Society symposium proceedings |
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UA library record |
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van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. |
Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
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de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
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Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. |
Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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