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Author | van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. | ||||
Title | Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images | Type | A1 Journal article | ||
Year | 1994 | Publication | Fresenius' journal of analytical chemistry | Abbreviated Journal | |
Volume | 350 | Issue | Pages | 440-447 | |
Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | A1994PR64400005 | Publication Date | 2004-10-19 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume ![]() |
Series Issue | Edition | |||
ISSN | 0937-0633; 1432-1130 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:9505 | Serial | 8442 | ||
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