| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Moldovan, D.; Peeters, F.M. |
Strain engineering of the electronic properties of bilayer graphene quantum dots: Strain engineering of the electronic properties of bilayer graphene quantum dots |
2015 |
Physica status solidi: rapid research letters |
10 |
9 |
UA library record; WoS full record; WoS citing articles |
| Wu, M.F.; Zhou, S.; Yao, S.; Zhao, Q.; Vantomme, A.; van Daele, B.; Piscopiello, E.; Van Tendeloo, G.; Tong, Y.Z.; Yang, Z.J.; Yu, T.J.; Zhang, G.Y. |
High precision determination of the elastic strain of InGaN/GaN multiple quantum wells |
2004 |
Journal of vacuum science and technology: B: microelectronics and nanometer structures |
22 |
15 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
| Leys, F.E.; March, N.H.; Lamoen, D. |
High pressure limiting forms of the zero-temperature equations of state of Ta and Pu from relativistic Thomas-Fermi theory |
2003 |
Physical Review B |
67 |
1 |
UA library record; WoS full record; WoS citing articles |
| Vagov, A.; Croitoru, M.D.; Axt, V.M.; Kuhn, T.; Peeters, F.M. |
High pulse area undamping of Rabi oscillations in quantum dots coupled to phonons |
2006 |
Physica status solidi B – Basic solid state physics |
243 |
16 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
| Razdobarin, A.G.; Mukhin, E.E.; Semenov, V.V.; Yu.Tolstyakov, S.; Kochergin, M.M.; Kurskiev, G.S.; Podushnikova, K.A.; Kirilenko, D.A.; Sitnikova, A.A.; Gorodetsky, А.Е.; Bukhovets, V.L.; Zalavutdinov, R.K.; Zakharov, А.P.; Arkhipov, I.I.; Voitsenya, V.S.; Bondarenko, V.N.; Konovalov, V.G.; Ryzhkov, I.V.; |
High reflective mirrors for in-vessel applications in ITER |
2010 |
Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment |
623 |
4 |
UA library record; WoS full record; WoS citing articles |
| Shpanchenko, R.V.; Nistor, L.; Van Tendeloo, G.; Amelinckx, S.; Antipov, E.V.; Kovba, L.M. |
High resolution electron microscopic study of Ba7Sc6Al2O19 and related phases |
1994 |
Journal of solid state chemistry |
113 |
3 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Volkov, V.; Gijbels, R.; Jacob, W.; Vargaftik, M.; Moiseev, I.; Van Tendeloo, G. |
High-resolution electron microscopy and electron energy-loss spectroscopy of giant palladium clusters |
1995 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
34 |
22 |
UA library record; WoS full record; WoS citing articles |
| Nistor, L.; Nistor, S.V.; Dincã, G.; van Landuyt, J.; Schoemaker, D.; Copaciu, V.; Georgeoni, P.; Arnici, N. |
High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis |
1999 |
Diamonds an related materials |
8 |
7 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
| Frangis, N.; van Landuyt, J.; Lartiprete, R.; Martelli, S.; Borsella, E.; Chiussi, S.; Castro, J.; Leon, B. |
High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial SixGe1-x alloys produced through laser induced processing |
1998 |
Applied physics letters |
72 |
16 |
UA library record; WoS full record; WoS citing articles |
| van Landuyt, J. |
High resolution electron microscopy for materials |
1992 |
|
|
7 |
UA library record; WoS full record; WoS citing articles |
| van Landuyt, J.; Vanhellemont, J. |
High-resolution electron microscopy for semiconducting materials science |
1994 |
|
|
|
UA library record |
| Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
High-resolution electron microscopy : from imaging toward measuring |
2002 |
IEEE transactions on instrumentation and measurement |
51 |
13 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G. |
High resolution electron microscopy in materials research |
1998 |
Journal of materials chemistry |
8 |
8 |
UA library record; WoS full record; WoS citing articles |
| Volkov, V.V.; Van Tendeloo, G.; Vargaftik, M.N.; Moiseev, I.I. |
High-resolution electron microscopy observations of large Pd clusters |
1993 |
Journal of crystal growth |
132 |
7 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G. |
High resolution electron microscopy of recent high Tc superconductors |
1994 |
European Crystallographic Meeting |
15 |
|
UA library record |
| Muto, S.; Van Tendeloo, G.; Amelinckx, S. |
High-resolution electron microscopy of structural defects in crystalline C60 and C70 |
1993 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
67 |
31 |
UA library record; WoS full record; WoS citing articles |
| Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. |
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs |
1999 |
Journal of applied physics |
85 |
6 |
UA library record; WoS full record; WoS citing articles |
| Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Ju, H.L.; Krishnan, K.M. |
High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films |
2000 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
80 |
52 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Van Aert, S.; Van Tendeloo, G. |
High resolution electron tomography |
2013 |
Current opinion in solid state and materials science |
17 |
24 |
UA library record; WoS full record; WoS citing articles |
| Turner, S.; Lazar, S.; Freitag, B.; Egoavil, R.; Verbeeck, J.; Put, S.; Strauven, Y.; Van Tendeloo, G. |
High resolution mapping of surface reduction in ceria nanoparticles |
2011 |
Nanoscale |
3 |
127 |
UA library record; WoS full record; WoS citing articles |
| Mattauch, S.; Heger, G.; Michel, K.H. |
High resolution neutron and X-ray diffraction studies as a function of temperature and electric field of the ferroelectric phase transition of RDP |
2004 |
Crystal research and technology |
39 |
12 |
UA library record; WoS full record; WoS citing articles |
| Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J. |
High resolution TEM observation of in situ colloid formation in CaF2 crystals |
1997 |
Materials science forum |
239-241 |
3 |
UA library record; WoS full record; WoS citing articles |
| Tirry, W.; Schryvers, D. |
High resolution TEM study of Ni4Ti3 precipitates in austenitic Ni51Ti49 |
2004 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
378 |
19 |
UA library record; WoS full record; WoS citing articles |
| Amin-Ahmadi, B.; Idrissi, H.; Delmelle, R.; Pardoen, T.; Proost, J.; Schryvers, D. |
High resolution transmission electron microscopy characterization of fcc -> 9R transformation in nanocrystalline palladium films due to hydriding |
2013 |
Applied physics letters |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
| Yandouzi, M.; Toth, L.; Schryvers, D. |
High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl |
1998 |
Nanostructured materials |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Van Aert, S. |
High-resolution visualization techniques : structural aspects |
2012 |
|
|
|
UA library record |
| Colla, M.-S.; Wang, B.; Idrissi, H.; Schryvers, D.; Raskin, J.-P.; Pardoen, T. |
High strength-ductility of thin nanocrystalline palladium films with nanoscale twins : on-chip testing and grain aggregate model |
2012 |
Acta materialia |
60 |
38 |
UA library record; WoS full record; WoS citing articles |
