toggle visibility
Search within Results:
Display Options:
Number of records found: 334

Select All    Deselect All
 | 
Citations
 | 
   print
Stabilization of the Perovskite Phase in the Y-Bi-O System By Using a BaBiO3 Buffer Layer”. Bouwmeester RL, de Hond K, Gauquelin N, Verbeeck J, Koster G, Brinkman A, Physica Status Solidi-Rapid Research Letters 13, 1970028 (2019). http://doi.org/10.1002/pssr.201970028
toggle visibility
Nord M, Verbeeck J (2019) Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis. 138–139
toggle visibility
Quantum wavefront shaping with a 48-element programmable phase plate for electrons”. Yu CP, Vega Ibañez F, Béché, A, Verbeeck J, SciPost Physics 15, 223 (2023). http://doi.org/10.21468/SciPostPhys.15.6.223
toggle visibility
Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
toggle visibility
In Situ Plasma Studies Using a Direct Current Microplasma in a Scanning Electron Microscope”. Grünewald L, Chezganov D, De Meyer R, Orekhov A, Van Aert S, Bogaerts A, Bals S, Verbeeck J, Advanced Materials Technologies (2024). http://doi.org/10.1002/admt.202301632
toggle visibility
Phase coexistence induced surface roughness in V2O3/Ni magnetic heterostructures”. Ignatova K, Vlasov E, Seddon SD, Gauquelin N, Verbeeck J, Wermeille D, Bals S, Hase TPA, Arnalds UB, APL Materials 12 (2024). http://doi.org/10.1063/5.0195961
toggle visibility
High-Throughput Morphological Chirality Quantification of Twisted and Wrinkled Gold Nanorods”. Vlasov E, Heyvaert W, Ni B, Van Gordon K, Girod R, Verbeeck J, Liz-Marzán LM, Bals S, ACS Nano (2024). http://doi.org/10.1021/acsnano.4c02757
toggle visibility
Stabilizing perovskite Pb(Mg0.33Nb0.67)O3-PbTiO3 thin films by fast deposition and tensile mismatched growth template”. Ni S, Houwman E, Gauquelin N, Chezganov D, Van Aert S, Verbeeck J, Rijnders G, Koster G, ACS applied materials and interfaces 16, 12744 (2024). http://doi.org/10.1021/ACSAMI.3C16241
toggle visibility
0 and &pi, phase Josephson coupling through an insulating barrier with magnetic impurities”. Vávra O, Gaži S, Golubović, DS, Vávra I, Dérer J, Verbeeck J, Van Tendeloo G, Moshchalkov VV, Physical review : B : condensed matter and materials physics 74, 020502 (2006). http://doi.org/10.1103/PhysRevB.74.020502
toggle visibility
2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy : reply”. Tan H, Turner S, Yucelen E, Verbeeck J, Van Tendeloo G, Physical review letters 108, 259702 (2012). http://doi.org/10.1103/PHYSREVLETT.108.259702
toggle visibility
2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy”. Tan H, Turner S, Yücelen E, Verbeeck J, Van Tendeloo G, Physical review letters 107, 107602 (2011). http://doi.org/10.1103/PhysRevLett.107.107602
toggle visibility
Aberration-corrected microscopy and spectroscopy analysis of pristine, nitrogen containing detonation nanodiamond”. Turner S, Shenderova O, da Pieve F, Lu Y-G, Yücelen E, Verbeeck J, Lamoen D, Van Tendeloo G, Physica status solidi : A : applications and materials science 210, 1976 (2013). http://doi.org/10.1002/pssa.201300315
toggle visibility
Accuracy and precision in model based EELS quantification”. Bertoni G, Verbeeck J, Ultramicroscopy 108, 782 (2008). http://doi.org/10.1016/j.ultramic.2008.01.004
toggle visibility
Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
toggle visibility
Advanced electron microscopy for advanced materials”. Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, van Dyck D, Advanced materials 24, 5655 (2012). http://doi.org/10.1002/adma.201202107
toggle visibility
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing”. Geuens I, Gijbels R, Jacob WA, Verbeeck A, de Keyzer R, The journal of imaging science and technology 36, 534 (1992)
toggle visibility
Analytical TEM study of CVD diamond growth on TiO2 sol-gel layers”. Lu Y-G, Verbeeck J, Turner S, Hardy A, Janssens SD, De Dobbelaere C, Wagner P, Van Bael MK, Van Tendeloo G, Diamond and related materials 23, 93 (2012). http://doi.org/10.1016/j.diamond.2012.01.022
toggle visibility
Artificial construction of the layered Ruddlesden-Popper manganite La2Sr2Mn3O10 by reflection high energy electron diffraction monitored pulsed laser deposition”. Palgrave RG, Borisov P, Dyer MS, McMitchell SRC, Darling GR, Claridge JB, Batuk M, Tan H, Tian H, Verbeeck J, Hadermann J, Rosseinsky MJ;, Journal of the American Chemical Society 134, 7700 (2012). http://doi.org/10.1021/ja211138x
toggle visibility
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction”. Mueller K, Krause FF, Béché, A, Schowalter M, Galioit V, Loeffler S, Verbeeck J, Zweck J, Schattschneider P, Rosenauer A, Nature communications 5, 5653 (2014). http://doi.org/10.1038/ncomms6653
toggle visibility
Atomic layer epitaxy of Ruddlesden-Popper SrO(SrTiO3)n films by means of metalorganic aerosol deposition”. Jungbauer M, Huehn S, Egoavil R, Tan H, Verbeeck J, Van Tendeloo G, Moshnyaga V, Applied physics letters 105, 251603 (2014). http://doi.org/10.1063/1.4905055
toggle visibility
Atomic resolution coordination mapping in Ca2FeCoO5 brownmillerite by spatially resolved electron energy-loss spectroscopy”. Turner S, Verbeeck J, Ramezanipour F, Greedan JE, Van Tendeloo G, Botton GA, Chemistry of materials 24, 1904 (2012). http://doi.org/10.1021/cm300640g
toggle visibility
Atomic resolution mapping of phonon excitations in STEM-EELS experiments”. Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J, Ultramicroscopy 147, 1 (2014). http://doi.org/10.1016/j.ultramic.2014.04.011
toggle visibility
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
toggle visibility
Atomic scale electron vortices for nanoresearch”. Verbeeck J, Schattschneider P, Lazar S, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Van Tendeloo G, Applied physics letters 99, 203109 (2011). http://doi.org/10.1063/1.3662012
toggle visibility
Atomic scale investigation of a PbTiO3/SrRuO3/DyScO3 heterostructure”. Egoavil R, Tan H, Verbeeck J, Bals S, Smith B, Kuiper B, Rijnders G, Koster G, Van Tendeloo G, Applied physics letters 102, 223106 (2013). http://doi.org/10.1063/1.4809597
toggle visibility
Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors”. Molina L, Tan H, Biermans E, Batenburg KJ, Verbeeck J, Bals S, Van Tendeloo G, Superconductor science and technology 24, 065019 (2011). http://doi.org/10.1088/0953-2048/24/6/065019
toggle visibility
Boron-rich inclusions and boron distribution in HPHT polycrystalline superconducting diamond”. Lu Y-G, Turner S, Ekimov EA, Verbeeck J, Van Tendeloo G, Carbon 86, 156 (2015). http://doi.org/10.1016/j.carbon.2015.01.034
toggle visibility
Casting light on the darkening of colors in historical paintings”. da Pieve F, Hogan C, Lamoen D, Verbeeck J, Vanmeert F, Radepont M, Cotte M, Janssens K, Gonze X, Van Tendeloo G, Physical review letters 111, 208302 (2013). http://doi.org/10.1103/PhysRevLett.111.208302
toggle visibility
Cation ordering and flexibility of the BO42- tetrahedra in incommensurately modulated CaEu2(BO4)4 (B = Mo, W) scheelites”. Abakumov AM, Morozov VA, Tsirlin AA, Verbeeck J, Hadermann J, Inorganic chemistry 53, 9407 (2014). http://doi.org/10.1021/ic5015412
toggle visibility
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: