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  Author Title Year Publication (down) Volume Times cited Additional Links Links
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 UA library record pdf url doi
van Landuyt, J. The evolution of HVEM application in antwerp 1991 Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39 UA library record; WoS full record doi
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles pdf doi
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