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Author | Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. | ||||
Title | Transmission electron microscopy of NdNiO3 thin films on silicon substrates | Type | A1 Journal article | ||
Year | 2000 | Publication | European physical journal: applied physics | Abbreviated Journal | Eur Phys J-Appl Phys |
Volume | 12 | Issue | Pages | 55-60 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Paris | Editor | ||
Language | Wos | 000165528800006 | Publication Date | 2003-06-20 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1286-0042;1286-0050; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 0.684 | Times cited | 16 | Open Access | |
Notes | Approved | Most recent IF: 0.684; 2000 IF: 0.535 | |||
Call Number | UA @ lucian @ c:irua:54781 | Serial | 3711 | ||
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