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Records |
Links |
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Author |
Eltayeb, M.A.H.; van Espen, P.J.; Cafmeyer, J.; Van Grieken, R.E.; Maenhaut, W. |
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Title |
Size-differentiated composition of aerosols in Khartoum, Sudan |
Type |
A1 Journal article |
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Year |
1992 |
Publication  |
The science of the total environment |
Abbreviated Journal |
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Volume |
120 |
Issue |
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Pages |
281-299 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Wos |
A1992JA65200008 |
Publication Date |
2003-09-12 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0048-9697; 1879-1026 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:2834 |
Serial |
8543 |
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| Permanent link to this record |
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Author |
Janssens, K.; van Espen, P. |
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Title |
A general-purpose interface between fortran and the low-level functions of the ibm-pc |
Type |
A1 Journal article |
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Year |
1988 |
Publication |
Trends in analytical chemistry |
Abbreviated Journal |
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Volume |
7 |
Issue |
4 |
Pages |
128-130 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Wos |
A1988M999800003 |
Publication Date |
2002-07-25 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0165-9936 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:149778 |
Serial |
5450 |
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Author |
Cabal, A.; Legrand, S.; Van den Bril, B.; Tote, K.; Janssens, K.; van Espen, P. |
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Title |
Study of the uniformity of aerosol filters by scanning MA-XRF |
Type |
A1 Journal article |
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Year |
2017 |
Publication |
X-ray spectrometry
T2 – 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
46 |
Issue |
5 |
Pages |
461-466 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Energy-dispersive X-ray fluorescence (XRF) is an attractive analytical method to determine the level of air pollution by heavy metals. The concentration of the filter in ng/cm(2) is obtained by direct comparison of the net characteristic line intensity of an element with that of a thin film standard. As the sampled area on the filter and the area of the standard are larger than the area analysed by the instrument, the distribution of the elements on the surface of both samples and standards have to be sufficiently uniform. If this is not the case, biased concentration estimates are obtained. Two scanning macro-XRF setups with a beam diameter of similar to 0.5 mm were used to investigate the distribution of elements in (1) commercially available (Micromatter) standards, (2) in-house quartz filter standards obtained with an aerosol generator and (3) particulatematter (PM10) collected on quartz filters by a Leckel SEQ 47/50 sampler. The uniformity of the Micromatter standards was better than 2%. At least some in-house standards showed a concave distribution with less material at the edges. The maximum bias introduced by this is less than 5%. Because of the limited sensitivity of scanning XRF compared with conventional XRF, the distribution of only a few common elements like Ca and Fe could be determined reliably in aerosol filters. The distribution of some heavy elements could only be measured in filters sampled in polluted regions. In general, the loading of particulate matter over the filters was uniform. Copyright (C) 2017 John Wiley & Sons, Ltd. |
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Wos |
000409246400026 |
Publication Date |
2017-03-21 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
4 |
Open Access |
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Notes |
; ; |
Approved |
Most recent IF: 1.298 |
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Call Number |
UA @ admin @ c:irua:145644 |
Serial |
5852 |
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| Permanent link to this record |
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Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. |
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Title |
Analysis of X-ray spectra by iterative least squares (AXIL): new developments |
Type |
A1 Journal article |
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Year |
1994 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
23 |
Issue |
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Pages |
278-285 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Wos |
A1994QF68500008 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:8933 |
Serial |
5471 |
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| Permanent link to this record |
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Author |
Janssens, K.; Vincze, L.; van Espen, P.; Adams, F. |
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Title |
Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers |
Type |
A1 Journal article |
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Year |
1993 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
22 |
Issue |
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Pages |
234-243 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Wos |
A1993LQ04200011 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:6117 |
Serial |
5736 |
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Author |
Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. |
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Title |
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses |
Type |
A1 Journal article |
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Year |
2005 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
34 |
Issue |
1 |
Pages |
19-27 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Corporate Author |
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Thesis |
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Place of Publication |
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Language |
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Wos |
000226260800004 |
Publication Date |
2004-09-14 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
23 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.298; 2005 IF: 1.372 |
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Call Number |
UA @ admin @ c:irua:52230 |
Serial |
5828 |
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| Permanent link to this record |
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Author |
Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. |
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Title |
Comparison of x-ray absorption and emission techniques for the investigation of paintings |
Type |
A1 Journal article |
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Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
3 |
Pages |
141-148 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
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Abstract |
Four x-ray techniques: computed radiography, emission radiography, energy-resolved radiography and imaging x-ray fluorescence were compared using four mock-up panel paintings. The paintings have different stratigraphy and pigments and are representative for different historical periods. One of the paintings has a hidden underlying painting. The type of pigments used mainly influences the information obtained by both the emission and absorption measurements; high-Z white pigment and high-Z color pigments giving the best contrast. Each of the techniques revealed interesting aspects of the paintings, but none of them could reveal the hidden painting to a satisfactory level. Due to the statistical quality of the spectral data, x-ray fluorescence gives elemental images with high contrast. The radiographic images are better to reveal the internal structure. Imaging x-ray fluorescence and energy-resolved radiography measurements can be done simultaneously, and the combination has the highest potential for the study of complex multilayer paintings. Copyright (c) 2015 John Wiley & Sons, Ltd. |
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Corporate Author |
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Place of Publication |
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Language |
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Wos |
000353644500010 |
Publication Date |
2015-02-05 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:126016 |
Serial |
7698 |
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| Permanent link to this record |
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Author |
Araujo, M.F.; van Espen, P.; Van Grieken, R. |
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Title |
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation |
Type |
A1 Journal article |
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Year |
1990 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
19 |
Issue |
1 |
Pages |
29-33 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
A semi-empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x-ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x-ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters. |
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Corporate Author |
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Place of Publication |
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Wos |
A1990CU24700005 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:116491 |
Serial |
7787 |
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| Permanent link to this record |
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Author |
Osán, J.; de Hoog, J.; van Espen, P.; Szalóki, I.; Ro, C.-U.; Van Grieken, R. |
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Title |
Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles |
Type |
A1 Journal article |
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Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
30 |
Issue |
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Pages |
419-426 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000172347800010 |
Publication Date |
2002-08-25 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:36091 |
Serial |
7939 |
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| Permanent link to this record |
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Author |
Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. |
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Title |
Performance of a new compact EDXRF spectrometer for aerosol analysis |
Type |
A1 Journal article |
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Year |
2002 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
31 |
Issue |
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Pages |
84-86 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000173653400015 |
Publication Date |
2002-10-06 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:36383 |
Serial |
8371 |
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| Permanent link to this record |
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Author |
Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. |
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Title |
M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range |
Type |
A1 Journal article |
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Year |
1993 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
22 |
Issue |
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Pages |
372-376 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Abstract |
Both energy- and wavelength-dispersive systems were used to obtain Malpha/Lalpha intensity ratios for Ta, W, Pt, Au, Pb and Bi at various overvoltages. A table of these ratios corrected for matrix absorption and detector efficiency is presented, in addition to an interpolatory function of Malpha/Lalpha generated ratios vs. overvoltage, for each element. In addition, three different ZAF correction models were used to predict both detected and generated ratios. Finally, experimental Mbeta/Malpha ratios measured at different overvoltages are presented for the six elements considered. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1993MB01200008 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:6221 |
Serial |
8649 |
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| Permanent link to this record |
