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A new method to calculate leakage current and its applications for sub-45nm MOSFETs”. Lujan GS, Magnus W, Soree B, Pourghaderi MA, Veloso A, van Dal MJH, Lauwers A, Kubicek S, De Gendt S, Heyns M, De Meyer K, Solid-State Device Research (ESSDERC), European Conference T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France. Ieee, S.l., page 489 (2005).
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Chemical composition and deterioration of glass excavated in the 15th-16th century fishermen town of Raversijde (Belgium)”. Schalm O, Caluwé, D, Wouters H, Janssens K, Verhaeghe F, Pieters M, Spectrochimica acta: part A: molecular and biomolecular spectroscopy 59, 1647 (2004). http://doi.org/10.1016/J.SAB.2004.07.012
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Composition of 12-18th century window glass in Belgium : non-figurative windows in secular buildings and stained-glass windows in religious buildings”. Schalm O, Janssens K, Wouters H, Caluwé, D, Spectrochimica acta: part B : atomic spectroscopy T2 –, 18th International Congress on X-Ray Optics and Microanalysis, September 25-30, 2005, National Institute of Nuclear Physics, Frascati, Italy 62, 663 (2007). http://doi.org/10.1016/J.SAB.2007.03.006
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Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration”. Schalm O, van der Linden V, Frederickx P, Luyten S, van der Snickt G, Caen J, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, Spectrochimica acta: part B : atomic spectroscopy 64, 812 (2009). http://doi.org/10.1016/j.sab.2009.06.005
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Determination of fluorine in uranium oxyfluoride particles as an indicator of particle age”. Kips R, Pidduck AJ, Houlton MR, Leenaers A, Mace JD, Marie O, Pointurier F, Stefaniak EA, Taylor PDP, van den Berghe S, van Espen P, Van Grieken R, Wellum R, Spectrochimica acta: part B : atomic spectroscopy 64, 199 (2009). http://doi.org/10.1016/J.SAB.2008.12.001
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Polarized-beam high-energy EDXRF in geological samples”. Čevik U, Akbulut S, Makarovska Y, Van Grieken R, Spectroscopy letters 46, 36 (2013). http://doi.org/10.1080/00387010.2012.661015
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Control and readout of current-induced magnetic flux quantization in a superconducting transformer”. Kerner C, Hackens B, Golubović, DS, Poli S, Faniel S, Magnus W, Schoenmaker W, Bayot V, Maes H, Superconductor science and technology 22, 025001 (2009). http://doi.org/10.1088/0953-2048/22/2/025001
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Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films”. Molina-Luna L, Duerrschnabel M, Turner S, Erbe M, Martinez GT, Van Aert S, Holzapfel B, Van Tendeloo G, Superconductor science and technology 28, 115009 (2015). http://doi.org/10.1088/0953-2048/28/11/115009
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BaHfO3artificial pinning centres in TFA-MOD-derived YBCO and GdBCO thin films”. Erbe M, Hänisch J, Hühne R, Freudenberg T, Kirchner A, Molina-Luna L, Damm C, Van Tendeloo G, Kaskel S, Schultz L, Holzapfel B, Superconductor science and technology 28, 114002 (2015). http://doi.org/10.1088/0953-2048/28/11/114002
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Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films”. Lamas JS, Leroy WP, Lu Y-G, Verbeeck J, Van Tendeloo G, Depla D, Surface and coatings technology 238, 45 (2014). http://doi.org/10.1016/j.surfcoat.2013.10.034
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Improving Molecule–Metal Surface Reaction Networks Using the Meta-Generalized Gradient Approximation: CO2Hydrogenation”. Cai Y, Michiels R, De Luca F, Neyts E, Tu X, Bogaerts A, Gerrits N, The Journal of Physical Chemistry C 128, 8611 (2024). http://doi.org/10.1021/acs.jpcc.4c01110
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Alkali metal intercalation in MXene/graphene heterostructures : a new platform for ion battery applications”. Demiroglu I, Peeters FM, Gulseren O, Cakir D, Sevik C, The journal of physical chemistry letters 10, 727 (2019). http://doi.org/10.1021/ACS.JPCLETT.8B03056
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Determination of Dynamically Stable Electrenes toward Ultrafast Charging Battery Applications”. Kocabas T, Ozden A, Demiroglu I, Cakir D, Sevik C, The journal of physical chemistry letters 9, 4267 (2018). http://doi.org/10.1021/ACS.JPCLETT.8B01468
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Unveiling the electronic structure of pseudotetragonal WO₃, thin films”. Mazzola F, Hassani H, Amoroso D, Chaluvadi SK, Fujii J, Polewczyk V, Rajak P, Koegler M, Ciancio R, Partoens B, Rossi G, Vobornik I, Ghosez P, Orgiani P, The journal of physical chemistry letters 14, 7208 (2023). http://doi.org/10.1021/ACS.JPCLETT.3C01546
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On the control and effect of water content during the electrodeposition of Ni nanostructures from deep eutectic solvents”. Cherigui EAM, Şentosun K, Mamme MH, Lukaczynska M, Terryn H, Bals S, Ustarroz J, The journal of physical chemistry: C : nanomaterials and interfaces 122, 23129 (2018). http://doi.org/10.1021/acs.jpcc.8b05344
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Impact of urban street canyon architecture on local atmospheric pollutant levels and magneto-chemical PM10 composition : an experimental study in Antwerp, Belgium”. Hofman J, Castanheiro A, Nuyts G, Joosen S, Spassov S, Blust R, De Wael K, Lenaerts S, Samson R, The science of the total environment 712, 135534 (2019). http://doi.org/10.1016/J.SCITOTENV.2019.135534
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Spatial monitoring of organohalogen compounds in surface water and sediments of a rural-urban river basin in Tanzania”. Hellar-Kihampa H, De Wael K, Lugwisha E, Govindan M, Covaci A, Van Grieken R, The science of the total environment 447, 186 (2013). http://doi.org/10.1016/J.SCITOTENV.2012.12.083
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Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy”. Lumbeeck G, Delvaux A, Idrissi H, Proost J, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 707, 138076 (2020). http://doi.org/10.1016/j.tsf.2020.138076
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RSV frequency in children below 2 years hospitalized for lower respiratory tract infections”. Hacimustafaoglu M, Celebi S, Bozdemir SE, Ozgur T, Ozcan I, Guray A, Çakir D, Turkish Journal Of Pediatrics 55, 130 (2013)
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Dynamic scattering theory for dark-field electron holography of 3D strain fields”. Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hytch M, Ultramicroscopy 136, 42 (2014). http://doi.org/10.1016/j.ultramic.2013.07.007
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Dynamical effects in strain measurements by dark-field electron holography”. Javon E, Lubk, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hytch MJ, Ultramicroscopy 147, 70 (2014). http://doi.org/10.1016/j.ultramic.2014.06.005
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Electron diffraction effects of conical, helically wound, graphite whiskers”. Luyten W, Krekels T, Amelinckx S, Van Tendeloo G, van Dyck D, van Landuyt J, Ultramicroscopy 49, 123 (1993). http://doi.org/10.1016/0304-3991(93)90219-N
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Prospects for versatile phase manipulation in the TEM : beyond aberration correction”. Guzzinati G, Clark L, Béché, A, Juchtmans R, Van Boxem R, Mazilu M, Verbeeck J, Ultramicroscopy 151, 85 (2015). http://doi.org/10.1016/j.ultramic.2014.10.007
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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Real-space mapping of electronic orbitals”. Stefan Löffler, Matthieu Bugnet, Nicolas Gauquelin, Sorin Lazar, Elias Assmann, Karsten Held, Gianluigi A Botton, Peter Schattschneider, Ultramicroscopy 177, 26 (2017). http://doi.org/10.1016/j.ultramic.2017.01.018
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Bandgap measurement of high refractive index materials by off-axis EELS”. Vatanparast M, Egoavil R, Reenaas TW, Verbeeck J, Holmestad R, Vullum PE, Ultramicroscopy 182, 92 (2017). http://doi.org/10.1016/J.ULTRAMIC.2017.06.019
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Demonstration of a 2 × 2 programmable phase plate for electrons”. Verbeeck J, Béché, A, Müller-Caspary K, Guzzinati G, Luong MA, Den Hertog M, Ultramicroscopy 190, 58 (2018). http://doi.org/10.1016/j.ultramic.2018.03.017
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Exploring possibilities of band gap measurement with off-axis EELS in TEM”. Korneychuk S, Partoens B, Guzzinati G, Ramaneti R, Derluyn J, Haenen K, Verbeeck J, Ultramicroscopy 189, 76 (2018). http://doi.org/10.1016/J.ULTRAMIC.2018.03.021
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Efficient first principles simulation of electron scattering factors for transmission electron microscopy”. Susi T, Madsen J, Ludacka U, Mortensen JJ, Pennycook TJ, Lee Z, Kotakoski J, Kaiser U, Meyer JC, Ultramicroscopy 197, 16 (2019). http://doi.org/10.1016/J.ULTRAMIC.2018.11.002
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