Records |
Author |
van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Title |
Acquisition of the EELS data cube by tomographic reconstruction |
Type |
A1 Journal article |
Year |
2006 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
106 |
Issue |
4/5 |
Pages |
269-276 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
Energy filtered TEM, EFTEM, provides three-dimensional data, two spatial and one spectral dimension. We propose to acquire these data by measuring a series of images with a defocused energy filter. It will be shown that each image is a projection of the data on the detector and that reconstruction of the data out of a sufficient number of such projections using a tomographic reconstruction algorithm is possible. This technique uses only a fraction of the electron dose an energy filtered series (EFS) needs for the same spectral and spatial resolution and the same mean signal-to-noise ratio. (c) 2005 Elsevier B.V. All rights reserved. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000236042300003 |
Publication Date |
2005-11-30 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
6 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.843; 2006 IF: 1.706 |
Call Number |
UA @ lucian @ c:irua:56910UA @ admin @ c:irua:56910 |
Serial |
55 |
Permanent link to this record |
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|
|
Author |
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
Title |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
Type |
A1 Journal article |
Year |
1992 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
40 |
Issue |
|
Pages |
151-162 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
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Wos |
A1992HN13400005 |
Publication Date |
2002-10-18 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.436 |
Times cited |
10 |
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ lucian @ c:irua:4094 |
Serial |
1581 |
Permanent link to this record |
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|
|
Author |
Potapov, P.L.; Schryvers, D. |
Title |
Measuring the absolute position of EELS ionisation edges in a TEM |
Type |
A1 Journal article |
Year |
2004 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
99 |
Issue |
|
Pages |
73-85 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000220804700005 |
Publication Date |
2003-08-12 |
Series Editor |
|
Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
29 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.843; 2004 IF: 2.215 |
Call Number |
UA @ lucian @ c:irua:48781 |
Serial |
1970 |
Permanent link to this record |
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Author |
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. |
Title |
Tomographic spectroscopic imaging; an experimental proof of concept |
Type |
A1 Journal article |
Year |
2009 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
109 |
Issue |
4 |
Pages |
296-303 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
Recording the electron energy loss spectroscopy data cube with a series of energy filtered images is a dose inefficient process because the energy slit blocks most of the electrons. When recording the data cube by scanning an electron probe over the sample, perfect dose efficiency is attained; but due to the low current in nanoprobes, this often is slower, with a smaller field of view. In W. Van den Broek et al. [Ultramicroscopy, 106 (2006) 269], we proposed a new method to record the data cube, which is more dose efficient than an energy filtered series. It produces a set of projections of the data cube and then tomographically reconstructs it. In this article, we demonstrate these projections in practice, we present a simple geometrical model that allows for quantification of the projection angles and we present the first successful experimental reconstruction, all on a standard post-column instrument. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
000265345400003 |
Publication Date |
2008-12-10 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
1 |
Open Access |
|
Notes |
Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
Call Number |
UA @ lucian @ c:irua:77271 |
Serial |
3671 |
Permanent link to this record |
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Author |
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Title |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
Type |
A1 Journal article |
Year |
2017 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
176 |
Issue |
|
Pages |
194-199 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000403992200026 |
Publication Date |
2017-01-09 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
|
Edition |
|
ISSN |
0304-3991 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
1 |
Open Access |
OpenAccess |
Notes |
The authors acknowledge financial support from the Fund for Scientific Research-Flanders (G.0064.10N, G.0393.11N, G.0374.13N, G.0368.15N, G.0369.15N) and the Flemish Hercules 3 program for large infrastructure as well as financial support from the European Union Seventh Framework Programme (FP7/2007 – 2013) under Grant agreement no. 312483 (ESTEEM2). EKHS thanks EPSRC (EP/ K009702/1) and the Leverhulme trust (EM-2016-004) for support. DS and MN acknowledge financial support from the Japan Society for the Promotion of Science (JSPS, Japan) through the Grant-in-Aid for Scientific Research (A: No. 26249090) and the Strategic Young Researcher Overseas Visits Program for Accelerating Brain Circulation (R2408). |
Approved |
Most recent IF: 2.843 |
Call Number |
EMAT @ emat @c:irua:149654 |
Serial |
4914 |
Permanent link to this record |
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Author |
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
Title |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
Type |
A1 Journal article |
Year |
2004 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
33 |
Issue |
5 |
Pages |
326-333 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
London |
Editor |
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Language |
|
Wos |
000223880800002 |
Publication Date |
2004-04-01 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
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Edition |
|
ISSN |
0049-8246;1097-4539; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2004 IF: 1.391 |
Call Number |
UA @ lucian @ c:irua:48786 |
Serial |
1076 |
Permanent link to this record |