Author |
Title |
Year |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Volume |
Times cited |
Additional Links |
Koster, G.; Verbist, K.; Rijnders, G.; Rogalla, H.; Van Tendeloo, G.; Blank, D.H.A. |
Structure and properties of (Sr,Ca)CuO2-BaCuO2 superlattices grown by pulsed laser interval deposition |
2001 |
Physica: C : superconductivity |
353 |
8 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Rijnders, G.; Blank, D.H.A.; Van Tendeloo, G. |
TEM of ultra-thin DyBa2Cu3O7-x films deposited on TiO2 terminated SrTiO3 |
2001 |
Physica: C : superconductivity |
355 |
26 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; Bals, S.; Lamoen, D.; Luysberg, M.; Huijben, M.; Rijnders, G.; Brinkman, A.; Hilgenkamp, H.; Blank, D.H.A.; Van Tendeloo, G. |
Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces |
2010 |
Physical review : B : condensed matter and materials physics |
81 |
25 |
UA library record; WoS full record; WoS citing articles |
Samal, D.; Tan, H.; Molegraaf, H.; Kuiper, B.; Siemons, W.; Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Takamura, Y.; Arenholz, E.; Jenkins, C.A.; Rijnders, G.; Koster, G. |
Experimental evidence for oxygen sublattice control in polar infinite layer SrCuO2 |
2013 |
Physical review letters |
111 |
29 |
UA library record; WoS full record; WoS citing articles |
Chen, B.; Gauquelin, N.; Reith, P.; Halisdemir, U.; Jannis, D.; Spreitzer, M.; Huijben, M.; Abel, S.; Fompeyrine, J.; Verbeeck, J.; Hilgenkamp, H.; Rijnders, G.; Koster, G. |
Thermal-strain-engineered ferromagnetism of LaMnO3/SrTiO3 heterostructures grown on silicon |
2020 |
Physical review materials |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
Araizi-Kanoutas, G.; Geessinck, J.; Gauquelin, N.; Smit, S.; Verbeek, X.H.; Mishra, S.K.; Bencok, P.; Schlueter, C.; Lee, T.-L.; Krishnan, D.; Fatermans, J.; Verbeeck, J.; Rijnders, G.; Koster, G.; Golden, M.S. |
Co valence transformation in isopolar LaCoO3/LaTiO3 perovskite heterostructures via interfacial engineering |
2020 |
Physical review materials |
4 |
13 |
UA library record; WoS full record; WoS citing articles |
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |