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Author Title Year Publication (up) Volume Times cited Additional Links
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles
Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> 2004 Vacuum: the international journal and abstracting service for vacuum science and technology 76 2 UA library record; WoS full record; WoS citing articles
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments 2004 X-ray spectrometry 33 13 UA library record; WoS full record; WoS citing articles
Spolnik, Z.; Tsuji, K.; Van Grieken, R. Grazing-exit electron probe x-ray microanalysis of light elements in particles 2004 X-ray spectrometry 33 UA library record; WoS full record; WoS citing articles
Lebedev, O.I.; Van Tendeloo, G. Phase transitions: an alternative for stress accommodation in CMR manganate films 2004 Zeitschrift für Metallkunde 95 UA library record; WoS full record