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Dislocation structures and the role of grain boundaries in cyclically deformed Ni micropillars”. Samaee V, Sandfeld S, Idrissi H, Groten J, Pardoen T, Schwaiger R, Schryvers D, Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing 769, 138295 (2020). http://doi.org/10.1016/j.msea.2019.138295
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EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys”. Shi H, Frenzel J, Schryvers D, Materials science forum 738/739, 113 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.113
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Influence of 4H-SiC substrate miscut on the epitaxy and microstructure of AlGaN/GaN heterostructures”. Gkanatsiou A, Lioutas CB, Frangis N, Polychroniadis EK, Prystawko P, Leszczynski M, Altantzis T, Van Tendeloo G, Materials science in semiconductor processing 91, 159 (2019). http://doi.org/10.1016/j.mssp.2018.11.008
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Hf/porphyrin-based metal-organic framework PCN-224 for CO2 cycloaddition with epoxides”. Carrasco S, Orcajo G, Martínez F, Imaz I, Kavak S, Arenas-Esteban D, Maspoch D, Bals S, Calleja G, Horcajada P, Materials Today Advances 19, 100390 (2023). http://doi.org/10.1016/j.mtadv.2023.100390
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Some examples of electron microscopy studies of microstructures and phase transitions in solids”. Schryvers D, Van Tendeloo G, van Landuyt J, Amelinckx S, Meccanica 30, 433 (1995). http://doi.org/10.1007/BF01557075
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A mass spectrometric study of the dissolution behavior of sanidine”. Adriaens A, Van 't dack L, Adams F, Gijbels R, Microchimica acta 120, 139 (1995). http://doi.org/10.1007/BF01244427
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Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007”. Van 't dack L, Gijbels R, Walker CT, Microchimica acta 161, 285 (2008). http://doi.org/10.1007/s00604-008-0958-5
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Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility”. Lujan GS, Magnus W, Sorée B, Ragnarsson LA, Trojman L, Kubicek S, De Gendt S, Heyns A, De Meyer K, Microelectronic engineering 80, 82 (2005). http://doi.org/10.1016/j.mee.2005.04.047
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Mesoscopic superconducting disks: fluxoids in a box”. Peeters FM, Schweigert VA, Deo PS, Microelectronic engineering 47, 393 (1999). http://doi.org/10.1016/S0167-9317(99)00242-7
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Material relaxation in chalcogenide OTS SELECTOR materials”. Clima S, Garbin D, Devulder W, Keukelier J, Opsomer K, Goux L, Kar GS, Pourtois G, Microelectronic engineering 215, 110996 (2019). http://doi.org/10.1016/J.MEE.2019.110996
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Neutral shallow donors near a metallic interface”. Slachmuylders AF, Partoens B, Magnus W, Peeters FM, Microelectronics journal 40, 753 (2009). http://doi.org/10.1016/j.mejo.2008.11.010
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Type II quantum dots in magnetic fields: excitonic behaviour”. Janssens KL, Partoens B, Peeters FM, Microelectronics journal 34, 347 (2003). http://doi.org/10.1016/S0026-2692(03)00023-5
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Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals”. Jain N, Hao Y, Parekh U, Kaltenegger M, Pedrazo-Tardajos A, Lazzaroni R, Resel R, Geerts YH, Bals S, Van Aert S, Micron 169, 103444 (2023). http://doi.org/10.1016/j.micron.2023.103444
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS”. Verlinden G, Gijbels R, Geuens I, Microscopy and microanalysis 8, 216 (2002). http://doi.org/10.1017/S1431927602020159
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Phase object reconstruction for 4D-STEM using deep learning”. Friedrich T, Yu C-P, Verbeeck J, Van Aert S, Microscopy and microanalysis 29, 395 (2023). http://doi.org/10.1093/MICMIC/OZAC002
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Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
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Damage mechanisms in selective laser melted AlSi10Mg under as built and different post-treatment conditions”. Zhao L, Macias JGS, Ding L, Idrissi H, Simar A, Microstructure And Processing 764, 138210 (2019). http://doi.org/10.1016/J.MSEA.2019.138210
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Fabrication, microstructure, and enhanced thermionic electron emission properties of vertically aligned nitrogen-doped nanocrystalline diamond nanorods”. Sankaran KJ, Deshmukh S, Korneychuk S, Yeh C-J, Thomas JP, Drijkoningen S, Pobedinskas P, Van Bael MK, Verbeeck J, Leou K-C, Leung K-T, Roy SS, Lin I-N, Haenen K, MRS communications 8, 1311 (2018). http://doi.org/10.1557/MRC.2018.158
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On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, MRS Japan: shape memory materials 18, 849 (1993)
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Decoupling the Characteristics of Magnetic Nanoparticles for Ultrahigh Sensitivity”. Chowdhury MS, Rösch EL, Esteban DA, Janssen K-J, Wolgast F, Ludwig F, Schilling M, Bals S, Viereck T, Lak A, Nano letters 23, 58 (2023). http://doi.org/10.1021/acs.nanolett.2c03568
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Intra-zero-energy Landau level crossings in bilayer graphene at high electric fields”. Xiang F, Gupta A, Chaves A, Krix ZE, Watanabe K, Taniguchi T, Fuhrer MS, Peeters FM, Neilson D, Milošević, MV, Hamilton AR, Nano letters 23, 9683 (2023). http://doi.org/10.1021/ACS.NANOLETT.3C01456
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Transformations of supported gold nanoparticles observed by in situ electron microscopy”. Liu P, Wu T, Madsen J, Schiotz J, Wagner JB, Hansen TW, Nanoscale 11, 11885 (2019). http://doi.org/10.1039/C9NR02731A
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Inverse heavy-atom effect in near infrared photoluminescent gold nanoclusters”. Pramanik G, Kvakova K, Thottappali MA, Rais D, Pfleger J, Greben M, El-Zoka A, Bals S, Dracinsky M, Valenta J, Cigler P, Nanoscale 12, 10462 (2021). http://doi.org/10.1039/D1NR90138A
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Quantitatively linking morphology and optical response of individual silver nanohedra”. Wang Y, Sztranyovszky Z, Zilli A, Albrecht W, Bals S, Borri P, Langbein W, Nanoscale 14, 11028 (2022). http://doi.org/10.1039/D2NR02131E
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Real-time tilt undersampling optimization during electron tomography of beam sensitive samples using golden ratio scanning and RECAST3D”. Craig TM, Kadu AA, Batenburg KJ, Bals S, Nanoscale 15, 5391 (2023). http://doi.org/10.1039/D2NR07198C
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Flattening conduction and valence bands for interlayer excitons in a moire MoS₂/WSe₂, heterobilayer”. Conti S, Chaves A, Pandey T, Covaci L, Peeters FM, Neilson D, Milošević, MV, Nanoscale , 1 (2023). http://doi.org/10.1039/D3NR01183F
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Molecular evidence for feedstock-dependent nucleation mechanisms of CNTs”. Khalilov U, Vets C, Neyts EC, Nanoscale Horizons 4, 674 (2019). http://doi.org/10.1039/C8NH00323H
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Achieving independent control of core diameter and carbon shell thickness in Pd-C core–shell nanoparticles by gas phase synthesis”. Singh V, Mehta BR, Sengar SK, Karakulina OM, Hadermann J, Kaushal A, Nanotechnology 28, 295603 (2017). http://doi.org/10.1088/1361-6528/aa7660
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Vacancy clustering effect on the electronic and transport properties of bilayer graphene nanoribbons”. Miranda LP, da Costa DR, Peeters FM, Costa Filho RN, Nanotechnology 34, 055706 (2023). http://doi.org/10.1088/1361-6528/AC9F50
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