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Author |
Title |
Year |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Volume |
Times cited |
Additional Links |
Links |
|
Willems, B.L.; Taylor, D.M.J.; Fritzsche, J.; Malfait, M.; Vanacken, J.; Moshchalkov, V.V.; Montoya, E.; Van Tendeloo, G. |
Temperature and magnetic field dependence of the voltagein GaAs films with superconducting Ga grains |
2008 |
European physical journal : B : condensed matter and complex systems |
66 |
|
UA library record; WoS full record |
|
|
Montoya, E.; Bals, S.; Van Tendeloo, G. |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
2008 |
Journal of microscopy |
231 |
|
UA library record; WoS full record |
|
|
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
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