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  Author Title Year Publication Volume Times cited Additional Links Links
Robberecht, H.; Van Grieken, R.; van Sprundel, M.; vanden Berghe, D.; Deelstra, H. Selenium in environmental and drinking waters of Belgium 1983 The science of the total environment 26 UA library record; WoS full record; WoS citing articles pdf doi
Robberecht, H.; vanden Berghe, D.; Deelstra, H.; Van Grieken, R. Selenium in the Belgian soils and its uptake by rye-grass 1982 The science of the total environment 25 UA library record; WoS full record; WoS citing articles pdf doi
Eltayeb, M.A.H.; van Espen, P.J.; Cafmeyer, J.; Van Grieken, R.E.; Maenhaut, W. Size-differentiated composition of aerosols in Khartoum, Sudan 1992 The science of the total environment 120 UA library record; WoS full record; WoS citing articles doi
Vleugels, G.; Fobe, B.; Dewolfs, R.; Van Grieken, R. Surface composition alteration of bare and treated limestones after ambient exposure 1994 The science of the total environment 151 UA library record; WoS full record; WoS citing articles doi
Herrebout, D.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J.; Vanhulsel, A. A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry 2003 IEEE transactions on plasma science 31 26 UA library record; WoS full record; WoS citing articles doi
Xhoffer, C.; Jacob, W.; Van Grieken, R. Application of electron energy loss spectroscopy to aerosols 1989 Journal of aerosol science 20 UA library record; WoS full record; WoS citing articles pdf doi
Rojas, C.M.; Otten, P.M.; Van Grieken, R.E. Characterization of airborne particulate matter collected over the North Sea 1989 Journal of aerosol science 20 UA library record; WoS full record; WoS citing articles pdf doi
Rojas, C.M.; Goossens, D.; Van Grieken, R. Penetration of atmospheric aerosols during collection in cellulose filters, studied by secondary ion mass spectrometry 1989 Journal of aerosol science 20 UA library record; WoS full record; WoS citing articles pdf doi
Abakumov, A.M.; Mironov, A.V.; Govorov, V.A.; Lobanov, M.V.; Rozova, M.G.; Antipov, E.V.; Lebedev, O.I.; Van Tendeloo, G. Synthesis and structural investigations on the new Sr1.32Mn0.83Cu0.17O3 compound 2003 Solid state sciences 5 8 UA library record; WoS full record; WoS citing articles doi
Abakumov, A.M.; Rozova, M.G.; Alekseeva, A.M.; Kovba, M.L.; Antipov, E.V.; Lebedev, O.I.; Van Tendeloo, G. Synthesis and structure of Sr2MnGaO5+\delta brownmillerites with variable oxygen content 2003 Solid state sciences 5 12 UA library record; WoS full record; WoS citing articles doi
Enjalbert, R.; Galy, J.; Castro, A.; Lidin, S.; Withers, R.; Van Tendeloo, G. Order and twining in Sb2W0.75Mo0.25O6 2003 Solid state sciences 5 3 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals 1995 Surface science : a journal devoted to the physics and chemistry of interfaces 337 10 UA library record; WoS full record; WoS citing articles doi
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate 1996 Applied surface science 102 9 UA library record; WoS full record; WoS citing articles doi
Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. High crystalline quality erbium silicide films on (100) silicon grown in high vacuum 1996 Applied surface science 102 14 UA library record; WoS full record; WoS citing articles doi
Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J. Photoelectric and electrical responses of several erbium silicide/silicon interfaces 1996 Applied surface science T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102 3 UA library record; WoS full record; WoS citing articles pdf doi
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks 2003 Applied surface science 203 15 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Kim, H.; Oh, K.-Y.; Yea, S.K.; Lee, C.B.; Jang, M.; Van Grieken, R. Single-particle characterization of urban aerosol particles collected in three Korean cities using low-Z electron probe x-ray microanalysis 2002 Environmental science and technology 36 UA library record; WoS full record; WoS citing articles doi
Yan, M.; Bogaerts, A.; Gijbels, R. Evolution of charged particle densities after laser-induced photodetachment in a strongly electronegative RF discharge 2002 IEEE transactions on plasma science 30 UA library record; WoS full record doi
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. Defects in high-dose oxygen implanted silicon : a TEM study 1991 Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42 4 UA library record; WoS full record; WoS citing articles pdf doi
Tso, H.C.; Vasilopoulos, P.; Peeters, F.M. Coupled electron-hole transport: generalized random-phase approximation and density functional theory 1994 Surface science : a journal devoted to the physics and chemistry of interfaces 305 5 UA library record; WoS full record; WoS citing articles doi
Leadley, D.R.; Nicholas, R.J.; Singleton, J.; Xu, W.; Peeters, F.M.; Devreese, J.T.; van Bockstal, L.; Herlach, F.; Perenboom, J.A.A.J.; Harris, J.J.; Foxon, C.T. Disappearance of magnetophonon resonance at high magnetic fields in GaAs-GaAlAs heterojunctions 1994 Surface science : a journal devoted to the physics and chemistry of interfaces 305 1 UA library record; WoS full record; WoS citing articles doi
Helm, M.; Peeters, F.M.; de Rosa, F.; Colas, E.; Harbison, J.P.; Florez, L.T. Infrared-spectroscopy of subbands, minibands, and donors in GaAs/AlGaAs superlattices 1992 Surface science : a journal devoted to the physics and chemistry of interfaces T2 – 9TH INTERNATIONAL CONF ON THE ELECTRONIC PROPERTIES OF TWO-DIMENSIONAL, SYSTEMS ( EP2DS-9 ) / 5TH INTERNATIONAL CONF ON MODULATED SEMICONDUCTOR, STRUCTURES ( MSS-5 ), JUL 263 5 UA library record; WoS full record; WoS citing articles pdf doi
Peeters, F.M.; Wu, X.G.; Devreese, J.T.; Watts, M.; Nicholas, R.J.; Howell, D.F.; van Bockstal, L.; Herlach, F.; Langerak, C.J.G.M.; Singleton, J.; Chevy, A. Resonant magnetopolaron coupling to both polar and neutral optical phonons in the layer compound InSe 1992 Surface science 263 4 UA library record; WoS full record; WoS citing articles doi
Shi, J.M.; Peeters, F.M.; Devreese, J.T. Transition energies of D- centers in a superlattice 1994 Surface science : a journal devoted to the physics and chemistry of interfaces 305 6 UA library record; WoS full record; WoS citing articles doi
Matulis, A.; Peeters, F.M.; Vasilopoulos, P. Two-dimensional tunneling through magnetic barriers 1994 Surface science : a journal devoted to the physics and chemistry of interfaces 305 2 UA library record; WoS full record; WoS citing articles doi
Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry 1993 Applied surface science T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63 13 UA library record; WoS full record; WoS citing articles pdf doi
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy 2001 Materials science in semiconductor processing 4 UA library record; WoS full record pdf doi
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures 2001 Materials science in semiconductor processing 4 6 UA library record; WoS full record; WoS citing articles pdf doi
Aerts, A.; Janssens, K.; Adams, F. Trace-level microanalysis of Roman glass from Khirbet Qumran, Israel 1999 Journal of archaeological science 26 UA library record; WoS full record; WoS citing articles doi
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