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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
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UA library record |
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de Backer, A. |
Quantitative atomic resolution electron microscopy using advanced statistical techniques |
2015 |
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UA library record |
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Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
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UA library record; WoS full record; |
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Heidari Mezerji, H. |
Quantitative electron tomography of nanoparticles |
2012 |
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UA library record |
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Martínez Alanis, G.T. |
Quantitative model-based high angle annular dark field scanning transmission electron microscopy |
2015 |
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|
UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
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UA library record |
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Bogaerts, R.; de Keyser, A.; Herlach, F.; Peeters, F.M.; DeRosa, F.; Palmstrøm, C.J.; Brehmer, D.; Allen, S.J. |
Quantum oscillations in the Hall effect of thin Sc1-xErxAs epitaxial layers burried in GaAs |
1995 |
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UA library record |
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Vlasov, I.I.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A. |
Recent results on characterization of detonation nanodiamonds |
2012 |
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UA library record |
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Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry |
1996 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
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UA library record; WoS full record; |
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Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
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UA library record |
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Wang, Y.J.; Nickel, H.A.; McCombe, B.D.; Peeters, F.M.; Hai, G.Q.; Shi, J.M.; Devreese, J.T.; Wu, X.G. |
Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields |
1997 |
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UA library record |
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Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
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UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
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UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
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UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1996 |
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UA library record |
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Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
The selective imaging of “substructures” in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41 |
1992 |
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UA library record |
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Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
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UA library record; WoS full record; |
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Xu, W.; Vasilopoulos, P.; Das, M.P.; Peeters, F.M. |
Self-consistent g* factor and spin-split Landau levels in strong magnetic fields and at low temperatures |
1995 |
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UA library record |
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Peeters, F.M. |
Semiconductor |
1997 |
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UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
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UA library record; WoS full record; |
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Elmonov, A.A.; Yusupov, M.S.; Dzhurakhalov, A.A.; Bogaerts, A. |
Sputtering of Si(001) and SiC(001) by grazing ion bombardment |
2008 |
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|
UA library record; WoS full record; |
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Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
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|
UA library record |
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Egoavil, R. |
STEM investigation of complex oxides at the atomic scale |
2014 |
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|
UA library record |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
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UA library record |
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Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
Stress analysis with convergent beam electron diffraction around NMOS transistors |
2001 |
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|
UA library record; WoS full record; |
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Nasr Esfahani, D. |
Strongly correlated electronic systems : influence of electric field and doping |
2014 |
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|
UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
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|
UA library record |
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