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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers |
1999 |
Microelectronic engineering |
45 |
|
UA library record; WoS full record |
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Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J. |
Carbon nano-tubes: their formation process and observation by electron microscopy |
1993 |
Journal of crystal growth |
130 |
190 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
|
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Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
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de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D. |
Colloid size distributions in ion implanted glass |
1993 |
Journal of non-crystalline solids |
162 |
63 |
UA library record; WoS full record; WoS citing articles |
|
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Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J. |
Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”? |
1992 |
Journal of crystal growth |
121 |
43 |
UA library record; WoS full record; WoS citing articles |
|
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van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. |
Defects and growth mechanisms of AgCl(100) tabular crystals |
1998 |
Journal of crystal growth |
187 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. |
Electron diffraction effects of conical, helically wound, graphite whiskers |
1993 |
Ultramicroscopy |
49 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. |
Electron microscopical investigation of AgBr needle crystals |
1995 |
Journal of crystal growth |
151 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals |
1997 |
Journal of crystal growth |
172 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Frangis, N.; van Landuyt, J.; Grimaldi, M.G.; Calcagno, L. |
Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He+ |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France |
120 |
2 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. |
The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study |
1997 |
Journal of crystal growth |
181 |
9 |
UA library record; WoS full record; WoS citing articles |
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Hole, D.E.; Townsend, P.D.; Barton, J.D.; Nistor, L.C.; van Landuyt, J. |
Gallium colloid formation during ion implantation of glass |
1995 |
Journal of non-crystalline solids |
180 |
34 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction |
1997 |
Journal of crystal growth |
172 |
29 |
UA library record; WoS full record; WoS citing articles |
|
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Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. |
High crystalline quality erbium silicide films on (100) silicon grown in high vacuum |
1996 |
Applied surface science |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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van Landuyt, J.; Vanhellemont, J. |
High-resolution electron microscopy for semiconducting materials science |
1994 |
|
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UA library record |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
Ultramicroscopy |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
|
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. |
Ion beam synthesis of β-SiC at 9500C and structural characterization |
1996 |
Nuclear instruments and methods in physics research |
B112 |
|
UA library record |
|
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Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. |
Ion beam synthesis of \beta-SiC at 950 degrees C and structural characterization |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr |
112 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. |
Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
337 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Nistor, L.; Buschmann, V.; Ralchenko, V.; Dinca, G.; Vlasov, I.; van Landuyt, J.; Fuess, H. |
Microstructural characterization of diamond films deposited on c-BN crystals |
2000 |
Diamond and related materials
T2 – 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC |
9 |
9 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 |
1997 |
Journal of crystal growth |
172 |
23 |
UA library record; WoS full record; WoS citing articles |
|
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Smolin, A.A. |
Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization |
1997 |
Diamond and related materials |
6 |
116 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; van Landuyt, J.; Vanhellemont, J.; Aseev, A.L. |
Observation of vacancy clustering in FZ-Si crystals during in situ electron irradiation in a high voltage electron microscope |
1996 |
Nuclear instruments and methods in physics research |
B112 |
4 |
UA library record; WoS full record; WoS citing articles |
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