| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. |
Advanced electron microscopy for advanced materials |
2012 |
Advanced materials |
24 |
107 |
UA library record; WoS full record; WoS citing articles |
| Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
|
|
|
UA library record |
| Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
|
|
|
UA library record |
| Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D.; Briers, J.; Bao, Y.; Geise, H.J. |
An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene) |
1996 |
Macromolecules |
29 |
10 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
| Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
2000 |
|
|
|
UA library record |
| Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
| van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. |
Do you believe that atoms stay in place when you observe them in HREM? |
2015 |
Micron |
68 |
11 |
UA library record; WoS full record; WoS citing articles |
| Schalm, O.; van der Linden, V.; Frederickx, P.; Luyten, S.; van der Snickt, G.; Caen, J.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration |
2009 |
Spectrochimica acta: part B : atomic spectroscopy |
64 |
28 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; van Dyck, D.; Van Tendeloo, G. |
Energy-filtered transmission electron microscopy: an overview |
2004 |
Spectrochimica acta: part B : atomic spectroscopy |
59 |
37 |
UA library record; WoS full record; WoS citing articles |
| Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Imaging from atomic structure to electronic structure |
2012 |
Micron |
43 |
|
UA library record; WoS full record |
| Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
High-resolution electron microscopy : from imaging toward measuring |
2002 |
IEEE transactions on instrumentation and measurement |
51 |
13 |
UA library record; WoS full record; WoS citing articles |
| Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. |
Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays |
1999 |
Applied physics letters |
75 |
481 |
UA library record; WoS full record; WoS citing articles |
| van Dyck, D.; Croitoru, M.D. |
Statistical method for thickness measurement of amorphous objects |
2007 |
Applied physics letters |
90 |
4 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; van Dyck, D. |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
2001 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
81 |
11 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. |
Towards quantitative high resolution electron microscopy? |
1995 |
Institute of physics conference series |
147 |
|
UA library record; WoS full record; |
| Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
|
|
|
UA library record |
| Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
| Lobato Hoyos, I.P.; van Dyck, D. |
An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints |
2014 |
Acta crystallographica: section A: foundations of crystallography |
70 |
19 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
| van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
| Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Physica status solidi: A |
143 |
7 |
UA library record; WoS full record; WoS citing articles |
| Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. |
Modification of the multislice method for calculating coherent STEM images |
1995 |
Physica status solidi: A: applied research |
150 |
5 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
|
|
|
UA library record |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
|
|
|
UA library record |
| Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. |
A peculiar diffraction effect in FCC crystals of C60 |
1992 |
Physica status solidi: A: applied research |
131 |
13 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
|
|
|
UA library record |
