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A first principles study of p-type defects in LaCrO3”. Dabaghmanesh S, Sarmadian N, Neyts EC, Partoens B, Physical chemistry, chemical physics 19, 22870 (2017). http://doi.org/10.1039/C7CP03575F
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Observation of hidden atomic order at the interface between Fe and topological insulator Bi2Te3”. Sanchez-Barriga J, Ogorodnikov II, Kuznetsov MV, Volykhov AA, Matsui F, Callaert C, Hadermann J, Verbitskiy NI, Koch RJ, Varykhalov A, Rader O, Yashina LV, Physical chemistry, chemical physics 19, 30520 (2017). http://doi.org/10.1039/C7CP04875K
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Gold nanoclusters with bright near-infrared photoluminescence”. Pramanik G, Humpolickova J, Valenta J, Kundu P, Bals S, Bour P, Dracinsky M, Cigler P, Nanoscale 10, 3792 (2018). http://doi.org/10.1039/C7NR06050E
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In situ tailoring of superconducting junctions via electro-annealing”. Lombardo J, Jelić, ŽL, Baumans XDA, Scheerder JE, Nacenta JP, Moshchalkov VV, Van de Vondel J, Kramer RBG, Milošević, MV, Silhanek AV, Nanoscale 10, 1987 (2018). http://doi.org/10.1039/C7NR08571K
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MXenes/graphene heterostructures for Li battery applications : a first principles study”. Aierken Y, Sevik C, Gulseren O, Peeters FM, Çakir D, Journal of materials chemistry A : materials for energy and sustainability 6, 2337 (2018). http://doi.org/10.1039/C7TA09001C
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Pushing the limits of applicability of REBCO coated conductor films through fine chemical tuning and nanoengineering of inclusions”. Rizzo F, Augieri A, Kursumovic A, Bianchetti M, Opherden L, Sieger M, Huehne R, Haenisch J, Meledin A, Van Tendeloo G, MacManus-Driscoll JL, Celentano G, Nanoscale 10, 8187 (2018). http://doi.org/10.1039/C7NR09428K
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Quantum anomalous Hall effect in a stable 1T-YN2 monolayer with a large nontrivial bandgap and a high Chern number”. Kong X, Li L, Leenaerts O, Wang W, Liu X-J, Peeters FM, Nanoscale 10, 8153 (2018). http://doi.org/10.1039/C8NR00571K
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Gel-based morphological design of zirconium metal-organic frameworks”. Bueken B, Van Velthoven N, Willhammar T, Stassin T, Stassen I, Keen DA, Baron GV, Denayer JFM, Ameloot R, Bals S, De Vos D, Bennett TD, Chemical science 8, 3939 (2017). http://doi.org/10.1039/C6SC05602D
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Annular dark-field transmission electron microscopy for low contrast materials”. Leroux F, Bladt E, Timmermans J-P, Van Tendeloo G, Bals S, Microscopy and microanalysis 19, 629 (2013). http://doi.org/10.1017/S1431927613000020
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS”. Verlinden G, Gijbels R, Geuens I, Microscopy and microanalysis 8, 216 (2002). http://doi.org/10.1017/S1431927602020159
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Computational aspects in quantitative EELS”. Verbeeck J, Van Aert S, Zhang L, Haiyan T, Schattschneider P, Rosenauer A, Microscopy and microanalysis 16, 240 (2010). http://doi.org/10.1017/S143192761005511X
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EELS investigations of different niobium oxide phases”. Bach D, Störmer H, Schneider R, Gerthsen D, Verbeeck J, Microscopy and microanalysis 12, 416 (2006). http://doi.org/10.1017/S1431927606060521
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EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure”. Bach D, Schneider R, Gerthsen D, Verbeeck J, Sigle W, Microscopy and microanalysis 15, 505 (2009). http://doi.org/10.1017/S143192760999105X
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements”. Bals S, Tirry W, Geurts R, Yang Z, Schryvers D, Microscopy and microanalysis 13, 80 (2007). http://doi.org/10.1017/S1431927607070018
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, Microscopy and microanalysis 15, 62 (2009). http://doi.org/10.1017/S1431927609090059
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Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM”. Grieten E, Caen J, Schryvers D, Microscopy and microanalysis 20, 1585 (2014). http://doi.org/10.1017/S1431927614012860
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Physical limits on atomic resolution”. van Dyck D, Van Aert S, den Dekker AJ, Microscopy and microanalysis 10, 153 (2004). http://doi.org/10.1017/S143192760404036X
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
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TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765
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Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts”. Ke X, Bals S, Cott D, Hantschel T, Bender H, Van Tendeloo G, Microscopy and microanalysis 16, 210 (2010). http://doi.org/10.1017/S1431927609991371
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Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558
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Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X
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Wet-STEM tomography : principles, potentialities and limitations”. Masenelli-Varlot K, Malchere A, Ferreira J, Heidari Mezerji H, Bals S, Messaoudi C, Garrido SM, Microscopy and microanalysis 20, 366 (2014). http://doi.org/10.1017/S1431927614000105
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The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements”. Gjorgievska E, Van Tendeloo G, Nicholson JW, Coleman NJ, Slipper IJ, Booth S, Microscopy and microanalysis 21, 392 (2015). http://doi.org/10.1017/S1431927615000057
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Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
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Defect related growth of tabular AgCl(100) crystals: a TEM study”. van Renterghem W, Schryvers D, van Landuyt J, van Roost C, , 389 (1998)
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