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On-chip very low strain rate rheology of amorphous olivine films”. Coulombier M, Baral P, Orekhov A, Dohmen R, Raskin JP, Pardoen T, Cordier P, Idrissi H, Acta materialia 266, 119693 (2024). http://doi.org/10.1016/J.ACTAMAT.2024.119693
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Tailoring mechanical properties and shear band propagation in ZrCu metallic glass nanolaminates through chemical heterogeneities and interface density”. Brognara A, Kashiwar A, Jung C, Zhang X, Ahmadian A, Gauquelin N, Verbeeck J, Djemia P, Faurie D, Dehm G, Idrissi H, Best JP, Ghidelli M, Small Structures , 2400011 (2024). http://doi.org/10.1002/SSTR.202400011
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Damage evaluation in graphene underlying atomic layer deposition dielectrics”. Tang X, Reckinger N, Poncelet O, Louette P, Urena F, Idrissi H, Turner S, Cabosart D, Colomer J-F, Raskin J-P, Hackens B, Francis LA, Scientific reports 5, 13523 (2015). http://doi.org/10.1038/srep13523
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Thin films of the spin ice compound Ho2Ti2O7”. Leusink DP, Coneri F, Hoek M, Turner S, Idrissi H, Van Tendeloo G, Hilgenkamp H, APL materials 2, 032101 (2014). http://doi.org/10.1063/1.4867222
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A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects”. Pardoen T, Colla M-S, Idrissi H, Amin-Ahmadi B, Wang B, Schryvers D, Bhaskar UK, Raskin J-P, Comptes rendus : physique 17, 485 (2016). http://doi.org/10.1016/j.crhy.2015.11.005
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Dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films”. Amin-Ahmadi B, Connétable D, Fivel M, Tanguy D, Delmelle R, Turner S, Malet L, Godet S, Pardoen T, Proost J, Schryvers D, Idrissi H, Acta materialia 111, 253 (2016). http://doi.org/10.1016/j.actamat.2016.03.054
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Direct imaging of boron segregation at dislocations in B:diamond heteroepitaxial films”. Turner S, Idrissi H, Sartori AF, Korneychuck S, Lu Y-G, Verbeeck J, Schreck M, Van Tendeloo G, Nanoscale 8, 2212 (2016). http://doi.org/10.1039/c5nr07535a
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Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films”. van der Rest A, Idrissi H, Henry F, Favache A, Schryvers D, Proost J, Raskin J-P, Van Overmeere Q, Pardoen T, Acta materialia 125, 27 (2017). http://doi.org/10.1016/j.actamat.2016.11.037
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Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy”. Heidari H, Rivero G, Idrissi H, Ramachandran D, Cakir S, Egoavil R, Kurttepeli M, Crabbé, AC, Hauffman T, Terryn H, Du Prez F, Schryvers D, Microscopy and microanalysis 22, 1222 (2016). http://doi.org/10.1017/S1431927616012484
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Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys”. Li K, Idrissi H, Sha G, Song M, Lu J, Shi H, Wang W, Ringer SP, Du Y, Schryvers D, Materials characterization 118, 352 (2016). http://doi.org/10.1016/j.matchar.2016.06.007
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Homogeneous flow and size dependent mechanical behavior in highly ductile Zr 65 Ni 35 metallic glass films”. Ghidelli M, Idrissi H, Gravier S, Blandin J-J, Raskin J-P, Schryvers D, Pardoen T, Acta materialia 131, 246 (2017). http://doi.org/10.1016/j.actamat.2017.03.072
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Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations”. Schryvers D, Salje EKH, Nishida M, De Backer A, Idrissi H, Van Aert S, Ultramicroscopy 176, 194 (2017). http://doi.org/10.1016/j.ultramic.2016.12.022
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Dislocation driven nanosample plasticity: new insights from quantitative in-situ TEM tensile testing”. Samaee V, Gatti R, Devincre B, Pardoen T, Schryvers D, Idrissi H, Scientific Reports 8, 12012 (2018). http://doi.org/10.1038/s41598-018-30639-8
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Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films”. Lumbeeck G, Idrissi H, Amin-Ahmadi B, Favache A, Delmelle R, Samaee V, Proost J, Pardoen T, Schryvers D, Journal Of Applied Physics 124, 225105 (2018). http://doi.org/10.1063/1.5055274
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Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp”. Guzzinati G, Altantzis T, Batuk M, De Backer A, Lumbeeck G, Samaee V, Batuk D, Idrissi H, Hadermann J, Van Aert S, Schryvers D, Verbeeck J, Bals S, Materials 11, 1304 (2018). http://doi.org/10.3390/ma11081304
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Enhancement of toughness of Al-to-steel Friction Melt Bonded welds via metallic interlayers”. Jimenez-Mena N, Jacques PJ, Ding L, Gauquelin N, Schryvers D, Idrissi H, Delannay F, Simar A, Materials science and engineering: part A: structural materials: properties, microstructure and processing 740-741, 274 (2019). http://doi.org/10.1016/j.msea.2018.10.101
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Study of the Q&prime, (Q)-phase precipitation in Al–Mg–Si–Cu alloys by quantification of atomic-resolution transmission electron microscopy images and atom probe tomography”. Ding L, Orekhov A, Weng Y, Jia Z, Idrissi H, Schryvers D, Muraishi S, Hao L, Liu Q, Journal of materials science 54, 7943 (2019). http://doi.org/10.1007/s10853-019-03427-6
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Influence of M23C6 dissolution on the kinetics of ferrite to austenite transformation in Fe-11Cr-0.06C stainless steel”. Miotti Bettanini A, Ding L, Mithieux J-D, Parrens C, Idrissi H, Schryvers D, Delannay L, Pardoen T, Jacques PJ, Materials &, design 162, 362 (2019). http://doi.org/10.1016/j.matdes.2018.12.005
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Dislocation structures and the role of grain boundaries in cyclically deformed Ni micropillars”. Samaee V, Sandfeld S, Idrissi H, Groten J, Pardoen T, Schwaiger R, Schryvers D, Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing 769, 138295 (2020). http://doi.org/10.1016/j.msea.2019.138295
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Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films”. Idrissi H, Ghidelli M, Béché, A, Turner S, Gravier S, Blandin J-J, Raskin J-P, Schryvers D, Pardoen T, Scientific reports 9, 13426 (2019). http://doi.org/10.1038/s41598-019-49910-7
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In Situ Quantitative Tensile Testing of Antigorite in a Transmission Electron Microscope”. Idrissi H, Samaee V, Lumbeeck G, Werf T, Pardoen T, Schryvers D, Cordier P, Journal Of Geophysical Research-Solid Earth 125 (2020). http://doi.org/10.1029/2019JB018383
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Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy”. Lumbeeck G, Delvaux A, Idrissi H, Proost J, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 707, 138076 (2020). http://doi.org/10.1016/j.tsf.2020.138076
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Novel class of nanostructured metallic glass films with superior and tunable mechanical properties”. Ghidelli M, Orekhov A, Bassi AL, Terraneo G, Djemia P, Abadias G, Nord M, Béché, A, Gauquelin N, Verbeeck J, Raskin J-p, Schryvers D, Pardoen T, Idrissi H, Acta Materialia , 116955 (2021). http://doi.org/10.1016/j.actamat.2021.116955
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“Branched&rdquo, structural transformation of the L12-Al3Zr phase manipulated by Cu substitution/segregation in the Al-Cu-Zr alloy system”. Ding L, Zhao M, Ehlers FJH, Jia Z, Zhang Z, Weng Y, Schryvers D, Liu Q, Idrissi H, Journal of materials science &, technology 185, 186 (2024). http://doi.org/10.1016/j.jmst.2023.11.015
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Tailoring Mechanical Properties of a-C:H:Cr Coatings”. Bagherpour A, Baral P, Colla M-S, Orekhov A, Idrissi H, Haye E, Pardoen T, Lucas S, Coatings 13, 2084 (2023). http://doi.org/10.3390/coatings13122084
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Influence of amorphous phase separation on the crystallization behavior of glass-ceramics in the BaO-TiO2-SiO2 system”. Boulay E, Ragoen C, Idrissi H, Schryvers D, Godet S, Journal of non-crystalline solids 384, 61 (2014). http://doi.org/10.1016/j.jnoncrysol.2013.06.023
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Review on TEM analysis of growth twins in nanocrystalline palladium thin films : toward better understanding of twin-related mechanisms in high stacking fault energy metals”. Idrissi H, Amin-Ahmadi B, Wang B, Schryvers D, Physica status solidi: B: basic research 251, 1111 (2014). http://doi.org/10.1002/pssb.201350161
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79”. Idrissi H, Schryvers D, Salje EKH, Zhang H, Carpenter MA, Moya X, , 02029 (2009). http://doi.org/10.1051/esomat/200902029
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