| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
1992 |
Ultramicroscopy |
41 |
17 |
UA library record; WoS full record; WoS citing articles |
| Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
| van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
2003 |
Ultramicroscopy |
98 |
26 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
| den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
| Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
| Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. |
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM |
2014 |
Ultramicroscopy |
141 |
6 |
UA library record; WoS full record; WoS citing articles |
| Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based atomic resolution tomographic algorithm |
2009 |
Ultramicroscopy |
109 |
17 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
16 |
UA library record; WoS full record; WoS citing articles |
| De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
| Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
| Lobato, I.; Van Dyck, D. |
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA |
2015 |
Ultramicroscopy |
156 |
32 |
UA library record; WoS full record; WoS citing articles |
| Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. |
Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals |
1994 |
Physica status solidi: A |
143 |
7 |
UA library record; WoS full record; WoS citing articles |
| Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. |
Modification of the multislice method for calculating coherent STEM images |
1995 |
Physica status solidi: A: applied research |
150 |
5 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
|
|
|
UA library record |
| Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
|
|
|
UA library record |
| Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. |
A peculiar diffraction effect in FCC crystals of C60 |
1992 |
Physica status solidi: A: applied research |
131 |
13 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
|
|
|
UA library record |
| Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
| van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
| Lobato Hoyos, I.P.; van Dyck, D. |
An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints |
2014 |
Acta crystallographica: section A: foundations of crystallography |
70 |
19 |
UA library record; WoS full record; WoS citing articles |
| Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
| Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
|
|
|
UA library record |
