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Author Title Year Publication Volume Times cited Additional Links
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy 2007 Microscopy and microanalysis 13 UA library record
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques 2013 Materials science forum T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739 2 UA library record; WoS full record; WoS citing articles
Batenburg, J.; Van Aert, S. Three-dimensional reconstruction of a nanoparticle at atomic resolution 2011 ERCIM news 86 UA library record
Van Aert, S. Meer zien met onzichtbaar licht 2007 Karakter : tijdschrift van wetenschap 18 UA library record
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. Electronically coupled complementary interfaces between perovskite band insulators 2006 Nature materials 5 315 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Aert, S.; Van Tendeloo, G. High resolution electron tomography 2013 Current opinion in solid state and materials science 17 24 UA library record; WoS full record; WoS citing articles
Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics 2011 Journal of physics: D: applied physics 44 99 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. Three-dimensional atomic imaging of crystalline nanoparticles 2011 Nature 470 341 UA library record; WoS full record; WoS citing articles
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) 2012 Zeitschrift für Kristallographie 227 4 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. Dedicated TEM on domain boundaries from phase transformations and crystal growth 2013 Phase transitions 86 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. Functional twin boundaries 2013 Phase transitions 86 5 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range 2006 Physical review letters 96 69 UA library record; WoS full record; WoS citing articles
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles
Shi, H.; Frenzel, J.; Martinez, G.T.; Van Rompaey, S.; Bakulin, A.; Kulkova, A.; Van Aert, S.; Schryvers, D. Site occupation of Nb atoms in ternary Ni-Ti-Nb shape memory alloys 2014 Acta materialia 74 21 UA library record; WoS full record; WoS citing articles
Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. Seeing and measuring in 3D with electrons 2014 Comptes rendus : physique 15 15 UA library record; WoS full record; WoS citing articles
Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. Atomic resolution electron tomography 2016 MRS bulletin 41 19 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials 2013 Science and technology of advanced materials 14 6 UA library record; WoS full record; WoS citing articles
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. Measuring lattice strain in three dimensions through electron microscopy 2015 Nano letters 15 87 UA library record; WoS full record; WoS citing articles