NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.	Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation	2001	Institute of physics conference series			UA library record; WoS full record;
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Clustering of vacancies on {113} planes in Si layers close to Si-Si₃N₄ interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation	1999	Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O.	Defect characterization in high temperature implanted 6H-SiC using TEM	1997	Nuclear instruments and methods in physics research: B	127/128	17	UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.	Direct observation of clusters in some FCC alloys by HREM	1994	Icem	13		UA library record; WoS full record;
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J.	EFTEM study of plasma etched low-k Si-O-C dielectrics	2001	Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R.	Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals	1994	Icem	13		UA library record; WoS full record;
Schryvers, D.; van Landuyt, J.T.	Electron microscopy study of twin sequences and branching in Ni₆₆Al₃₄ 3r martensite	1993	Proceedings Of The International Conference On Martensitic Transformations (icomat-92)		1	UA library record; WoS full record; WoS citing articles
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.	EM study of sensitisation of silver halide grains	1994	Icem	13		UA library record; WoS full record;
Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E.	Formation of diamond nanocrystals in laser-irradiated amorphous carbon films	1994	International Conference on the New Diamond Science and Technology	4		UA library record
Nistor, L.; Nistor, S.V.; Dincã, G.; van Landuyt, J.; Schoemaker, D.; Copaciu, V.; Georgeoni, P.; Arnici, N.	High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis	1999	Diamonds an related materials	8	7	UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Tanner, L.E.	HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys	1994	Icem	13		UA library record
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.	HREM study of Rb₆C₆₀ and helical carbon nanotubules	1994	Icem	13		UA library record
Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J.; Mironov, O.A.; Parker, E.H.C.	In situ HREM irradiation study of point-defect clustering in MBE-grown strained Si_1-xGe_x/(001)Si structures	2000	Physical review : B : condensed matter and materials physics	61	27	UA library record; WoS full record; WoS citing articles
Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J.	Laser thermotreatment of the SnO₂layers	1998	Eurosensors XII, vols 1 and 2			UA library record; WoS full record;
Nistor, L.; Van Tendeloo, G.; Amelinckx, S.; Shpanchenko, R.V.; van Landuyt, J.	Ordering and defects in Ba_nTa_xTi_yO_3n ternary oxides	1994	Electron Microscopy 1994, Vols 2a And 2b: Applications In Materials Sciences			UA library record; WoS full record;
Van Tendeloo, G.; van Heurck, C.; van Landuyt, J.; Amelinckx, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G.	Phase transitions in C60 and the related microstructure: a study by electron diffraction and electron microscopy	1992	Journal of physical chemistry	96	33	UA library record; WoS full record; WoS citing articles
Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A.	Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope	1995	Materials science and technology	11	7	UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Landuyt, J.	Electron microscopy study of twin sequences and branching in NissAl34 3R martensite	1992	ICOMAT
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J.	A 2a2b3c superstructure in hexagonal NiS_1-x: a study by means of electron diffraction and HREM	1993	Journal of crystal growth	126	4	UA library record; WoS full record; WoS citing articles
Lioutas, C.B.; Manolikas, C.; Van Tendeloo, G.; van Landuyt, J.	A 2a2a3c superstructure in hexagonal Ni_1-xS : a study by means of electron-diffraction and HRTEM	1993	Journal of crystal growth	126	4	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.	A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon	2003	Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK	340	4	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared absorption measurement of interstitial and precipitated oxygen in p⁺ silicon wafers	1999	Microelectronic engineering	45		UA library record; WoS full record
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J.	Carbon nano-tubes: their formation process and observation by electron microscopy	1993	Journal of crystal growth	130	190	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R.	Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry	1991	Journal of crystal growth	110	40	UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A.	Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas	1997	Journal of crystal growth	173	4	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E.	Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM	2001	Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY	308	3	UA library record; WoS full record; WoS citing articles
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D.	Colloid size distributions in ion implanted glass	1993	Journal of non-crystalline solids	162	63	UA library record; WoS full record; WoS citing articles
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J.	Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging	1997	Ultramicroscopy	69	11	UA library record; WoS full record; WoS citing articles
Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J.	Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”?	1992	Journal of crystal growth	121	43	UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.	Defects and growth mechanisms of AgCl(100) tabular crystals	1998	Journal of crystal growth	187	8	UA library record; WoS full record; WoS citing articles